Plasma Potential Diagnostics Using X-ray Spectra obtained with Semiconductor X-ray Detectors Developed by Our New Theory

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A new method for plasma potential diagnostics using plasma X-ray spectra is developed. In particular, newly developed semiconductor X-ray detectors are utilized ; these detectors are originally designed using our new theory on semiconductor X-ray responses.Localized positive electrostatic plasma potentials have the capability of plasma electron trapping. The maximum energy of the potential trapped electrons is in turn determined from the value of the potential, since the electron heatings beyond the maximum potential energy make the trapped electrons untrapped. The observation of such a maximum X-ray energy provides the identification of the spatially localized electron confining potentials.In fact, the comparison of potential values using this new method and the conventional potential diagnostics shows good agreement between the two. This new method also provides a new scaling law of the potential formation.