Plasma Potential Diagnostics Using X-ray Spectra obtained with Semiconductor X-ray Detectors Developed by Our New Theory

使用我们新理论开发的半导体 X 射线探测器获得的 X 射线光谱进行等离子体电势诊断

• 批准号: 06452418
• 负责人: CHO Teruji
• 金额: $ 3.2万
• 依托单位: University of Tsukuba
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for General Scientific Research (B)
• 财政年份: 1994
• 资助国家: 日本
• 起止时间: 1994 至 1995
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/en/grant/KAKENHI-PROJECT-06452418/
• 关键词: X-ray diagnostics; semiconductor detectors; plasma X-rays; potential diagnostics; a new potential observation; potential trapped electrons; maximum electron energy; X-ray detectors; X線感度理論; タンデムミラープラズマ; プラズマ計測; 電位計測; X線トモグラフィー; 電位生成機構; 半導体X線

A new method for plasma potential diagnostics using plasma X-ray spectra is developed. In particular, newly developed semiconductor X-ray detectors are utilized ; these detectors are originally designed using our new theory on semiconductor X-ray responses.Localized positive electrostatic plasma potentials have the capability of plasma electron trapping. The maximum energy of the potential trapped electrons is in turn determined from the value of the potential, since the electron heatings beyond the maximum potential energy make the trapped electrons untrapped. The observation of such a maximum X-ray energy provides the identification of the spatially localized electron confining potentials.In fact, the comparison of potential values using this new method and the conventional potential diagnostics shows good agreement between the two. This new method also provides a new scaling law of the potential formation.

提出了一种利用等离子体x射线谱诊断等离子体电位的新方法。特别是利用了新开发的半导体x射线探测器；这些探测器最初是根据我们关于半导体x射线响应的新理论设计的。局部正静电等离子体电位具有等离子体电子捕获能力。潜在被困电子的最大能量反过来由电势的值决定，因为超过最大势能的电子受热会使被困电子释放出来。这种最大x射线能量的观测提供了空间局域电子约束势的识别。实际上，用这种新方法与常规电位诊断方法的电位值比较表明，两者吻合良好。该方法还提供了一种新的潜在地层标度规律。

项目成果

M. Hirata, et al.: "Plasma Electron Temperature Diagnostics Using Semiconductor X-ray Detector Data Analysed By a New Theory on the X-ray Responses." Applied Radiation and Isotopes. 46 No.6/7. 491-492 (1995)

M. Hirata 等人：“利用 X 射线响应新理论分析的半导体 X 射线探测器数据进行等离子体电子温度诊断”。

M. Hirata, et. al.: "Plasma Diagnostics Using Vacuum Ultraviolet Radiation And Soft X-rays in the GAMMA 10 Tandem Mirror Device" Journal of Electron Spectroscopy And Related Phenomena. (in press).

M.平田等。

M. Hirata et. al.: "Plasma Diagnostics Using Vacuum Ultraviolet Radiation And Soft X-rays in the GAMMAIO Tandem Mirror Device" Journal of Election Spectroscopy And Related Phenomena. (in Press).

M.平田等人。

J. Kohagura et. al.,: "A Novel Analysis Method for Plasma Light And Soft X-ray Tomography Data Including the Three-Dimenstonal Diffusion in A Semiconductor Detector Array" Journal of Electron Spectroscopy And Related Phenomena. ((in Press))

J. Kohagura 等。

J. Kohagura, et. al.: "A Novel Analysis Method for Plasma Light and Soft X-ray Tomograpyh Data Including the Three-Dimensional Diffusion in A Semiconductor Detector Array" Journal of Electron Spectroscopy And Related Phenomena. (in press).

J. Kohagura 等。