Development of New Plasma Diagnostics Detectors for the Purpose of the Simultaneous Detection of X-rays, Electrons, Neutral Particles, and Ions with Their Species Resolution Having High Outputs in Wide Energy Ranges

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Our newly proposed theory on the x-ray-energy response of semiconductor detectors is applied for the design and fabrication of new semiconductor plasma detectors for simultaneously measurable x rays, electrons, neutral particles, and ions with their species resolution.This new detector is applied as a new collector using the application and combination with our developed differential-spectrum ion-energy analyzer with electrostatic slanted grids [see Rev. Sci. Instrum. 66 (1995) 4928]. This special detection structure is applied for distinguishing ions with positive charges and electrons with negative charges curved under the detector fields, as well as x rays and neutral particles with straight trajectories in the detector fields because of no charges.In addition, a semiconductor detector collector is used for distinguishing the x rays and neutral particles on the basis of the difference of the mean free path in the semiconductor detector (i.e., shorter struggling distance for neutral particles and longer penetration length for x rays.These differences are newly utilized by this research program for constructing new formula and computer simulation. These results for the new calculation method are based on the nuclear and electron interaction with the incident particles ; these details will be published in journals.Several papers have already been published in journals ; the references are listed in this report sheet (see the rear side of this short summary report). As shown in the papers, these methods have already been verified in plasma experiments and routinely applied in actual plasma diagnostics.