Development of New Plasma Diagnostics Detectors for the Purpose of the Simultaneous Detection of X-rays, Electrons, Neutral Particles, and Ions with Their Species Resolution Having High Outputs in Wide Energy Ranges

我们新提出的关于半导体探测器的X射线能量响应的理论被应用于设计和制造新的半导体等离子体探测器，用于同时测量X射线、电子、中性粒子和离子及其物种分辨率。这种新的探测器被用作新的收集器，使用我们开发的具有静电倾斜网格的差分谱离子能量分析器的应用和组合[见Rev. Sci.仪器66（1995）4928]。这种特殊的探测结构适用于区分带正电荷的离子和带负电荷的电子在探测器场中弯曲，以及由于不带电荷而在探测器场中具有直线轨迹的X射线和中性粒子。此外，利用半导体探测器收集器，根据半导体中平均自由程的差异，检测器（即，中性粒子的挣扎距离较短，而x射线的穿透长度较长，这些差异是本研究计划新利用的，以建立新的公式和计算机模拟。新计算方法的这些结果是基于核和电子与入射粒子的相互作用;这些细节将发表在期刊上。几篇论文已经在期刊上发表;参考文献列在本报告表中（见本简短总结报告的背面）。如论文所示，这些方法已经在等离子体实验中得到了验证，并在实际的等离子体诊断中得到了常规应用。

Our newly proposed theory on the x-ray-energy response of semiconductor detectors is applied for the design and fabrication of new semiconductor plasma detectors for simultaneously measurable x rays, electrons, neutral particles, and ions with their species resolution.This new detector is applied as a new collector using the application and combination with our developed differential-spectrum ion-energy analyzer with electrostatic slanted grids [see Rev. Sci. Instrum. 66 (1995) 4928]. This special detection structure is applied for distinguishing ions with positive charges and electrons with negative charges curved under the detector fields, as well as x rays and neutral particles with straight trajectories in the detector fields because of no charges.In addition, a semiconductor detector collector is used for distinguishing the x rays and neutral particles on the basis of the difference of the mean free path in the semiconductor detector (i.e., shorter struggling distance for neutral particles and longer penetration length for x rays.These differences are newly utilized by this research program for constructing new formula and computer simulation. These results for the new calculation method are based on the nuclear and electron interaction with the incident particles ; these details will be published in journals.Several papers have already been published in journals ; the references are listed in this report sheet (see the rear side of this short summary report). As shown in the papers, these methods have already been verified in plasma experiments and routinely applied in actual plasma diagnostics.