Analysis of Mechanism of Very fine Agglutinative Bonding Between Fine Gold Lead and Electric Pad On Integrated Circuit.
Analysis of Mechanism of Very fine Agglutinative Bonding Between Fine Gold Lead and Electric Pad On Integrated Circuit.
批准号:
10450273
负责人:
TAKAHASHI Yasuo
金额:
$7.04万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B).
财政年份:
1998
资助国家:
日本
项目状态:
已结题
起止时间:
1998 至 2000
中文摘要
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英文摘要
It is indispensable technology to develop the new microjoining used for the packaging process of IC and LSI of the electronics field. This is the basic technology which achieves the interconnection between integrated circuit electrodes and external leads such as the leadframe, and it is not the exaggeration. However, the materials used there are dissimilar to each other, and the optimization of the interconnection is not easy. Then, in the present study, the bonding mechanism between integrated circuit electrodes and gold fine wires and leads is analyzed and has been clarified from experiments and theoretical calculation results. Especially, material properties (difference between the mechanical properties of the gold fine lead/gold pad), transition of the bonding mechanism by the bonding load increase, the promoting effect of the wire deformation with the pad temperature increase, and the effects of the bonding tool shape on the interconnection formation, etc.were clarified. And also, … More the analysis for adhesional bonding mechanism at room temperature which is expected to be very important in the near future were carried out in the present study, and the increase phenomenon of the bond strength with the time after bonding was investigated and the mechanism was clarified. The results that were concretely obtained in the present study are classified into the following 8 points.1) The effect of material properties, bonding pressure, bonding temperature on the bonding process were analyzed.2) The analysis of the interfacial diffusion behavior between pad and fine wires and the change in the stress distribution with time.3) The transition of adhesional bonding mechanism with the bonding load increase.4) The numerical simulation of deformation process of pad and gold fine wire.5) The analysis of the effect of the bonding tool on the bonding process.6) Effect on the bonded interface extension of the pad thickness and effectiveness of the gold bump for the microjoining.7) Theory of adhesional bonding process between gold fine wire and pad, and also the quantification.8) Numerical examination of the bonded interface migration phenomenon and the abnormal formation of the grain boundary groove. Less
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Y.Takahashi, M.Inoue, K.Inoue: "Numerical Analysis of Fine Lead Bonding -Effect of Pad Thickness on Interfacial Deformation-"IEEE Trans.on CPT. Vol.22, No.2. 291-298 (1999)
Y.Takahashi、M.Inoue、K.Inoue:“细引线键合的数值分析 - 焊盘厚度对界面变形的影响 -”IEEE Trans.on CPT。
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高橋康夫,上杉勝洋,松坂状太: "アルゴンイオン衝撃により表面活性化された金ワイヤと金箔との凝着接合に関する検討"Proceeding of 7th Sympo.Mate 2001. 7. 9-12 (2001)
Yasuo Takahashi、Katsuhiro Uesugi、Shota Matsuzaka:“氩离子轰击激活的金线和金箔表面粘合的研究”Proceeding of 7th Sympo.Mate 2001. 7. 9-12 (2001)
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Y.Takahashi, M.Inoue, K.Inoue: "Numerical Analysis of Fine Lead Bonding -Effect of Pad Mechanical Properties on Interfacial Deformation-"IEEE Trans.on CPT. Vol.22, No.4. 558-566 (1999)
Y.Takahashi、M.Inoue、K.Inoue:“细引线键合的数值分析 - 焊盘机械性能对界面变形的影响 -”IEEE Trans.on CPT。
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Yasuo Takahashi: "Numerical Study of Fine Lead and Wire Bonding in Electronic Packaging"Apack'99, Proceeding, Singapore 8th-10th 12月. 454-461 (1999)
Yasuo Takahashi:“电子封装中细引线和引线键合的数值研究”Apack99,Proceeding,新加坡,12 月 8 日至 10 日,454-461(1999 年)。
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松坂壮太,高橋康夫,井上勝敬: "常温凝着接合における接合強度の時間依存性に関する研究"溶接学会論文集. 17. 583-588 (1999)
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