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Study on Impact Strength Evaluation of Micro-Solder Joints in Mobile Electronic Units

Study on Impact Strength Evaluation of Micro-Solder Joints in Mobile Electronic Units
移动电子装置微焊点冲击强度评价研究
批准号:
11555029
负责人:
SHIRATORI Masaki
金额:
$8.64万
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B).
财政年份:
1999
资助国家:
日本
项目状态:
已结题
起止时间:
1999 至 2000

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中文摘要
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英文摘要
Recently, the speed-up of the information processing and operation treatment speed due to multimedia needs of the electronic machine, and mobile trend of information technology units are proceeding rapidly. The miniaturization and lightening technologies are the keywords for mobile units electronic units. Furthermore the probability increase of mobile units dropping causes that the impact strength dominates its reliability. The purposes of this study are to develop a effective stress evaltuation method for the dropping behavior by using static finite element analytical system, and make clear dynamic failure mechanics of solder joints in mobile electronic units.The conclusions of this study were given as followings ;1) An impact testing equipment was developed to investigate the dynamic behavior of micro solder joints. Based upon the experimental results of dynamic tests of solder material properties, it was found that the dynamic yield stress is much higher than its static yield stress … More . This restults suggest that solder material can be treated elasticly, when dynamic behavior of solder joints is investigated.2) Cyclic dropping tests of PCB (printed circle board) mounted with a BGA (ball grid array) package were carried out. It was found that the interface fatigue crack is the main failure mode of BGA solder joints, and the interface crack concentrating in the intermeterics layer between the solder and Cu pad. Furthermore it was found that this interface crack mode is caused by the increase of solder yield stress due to dynamic deformation.3) Instead of dynamic finite element analysis, a static analytical method and a mode analytical method have been developed to simulate the dynamic behavior of PCB and solder joints. The proposed methods cant shorten the simulation time to 1/10 and can be used to study the effect of PCB vibration modes beside its first mode on the dynamic stress behavior in solder joints.Based upon the analytical results, it was found that the dynamic stress behavior in solder joints is affected greatly by the vibration modes of PCB and the location of the package. As a conclusion the impact reliability design of BGA package can be dealt by controlling the position of package corresponding to the vibration modes of PCB. Less
期刊论文(42)
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会议论文
Qiang Yu, M.Shiratori, S.Ikeda: "The Dynamics Characterization of Impact Strength for Solder Joints of BGA"Microjoining and Assembly Technology in Electrics. 7. 69-74 (2001)
于强、M.Shiratori、S.Ikeda:“BGA焊点冲击强度的动态表征”电气中的微连接和组装技术。
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通讯作者:
于強,白鳥正樹,池田真哉: "衝撃負荷を受ける実装BGAパッケージの動的特性"日本機械学会講演論文集. 00・17. 649-650 (2000)
Qiang Yu、Masaki Shiratori 和 Shinya Ikeda:“承受冲击负载的安装 BGA 封装的动态特性”日本机械工程师学会会议记录 00・17(2000 年)。
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白鳥正樹,于強 他2名: "BGAパッケージはんだ接合部の熱疲労信頼性簡易評価"日本機械学会論文集A編. 67・654. 216-224 (2001)
Masaki Shiratori、Qiang Yu 等 2 人:“BGA 封装焊点热疲劳可靠性的简单评估”,日本机械工程师学会会刊,A 版 67・654(2001 年)。
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