Development of CAE System for Fatigue Strength Design of Solder Joints in Surface Mount Devices
表面贴装器件焊点疲劳强度设计CAE系统的开发
基本信息
- 批准号:07455051
- 负责人:
- 金额:$ 5.38万
- 依托单位:
- 依托单位国家:日本
- 项目类别:Grant-in-Aid for Scientific Research (B)
- 财政年份:1995
- 资助国家:日本
- 起止时间:1995 至 1996
- 项目状态:已结题
- 来源:
- 关键词:
项目摘要
In order to study the get a cyclic stress-strain hysteresis in microelectronic solder joints during a temperature cyclic test, a TSOP,a BGA and a LCCC were modeled for FEA,and a stress-strain evaluating system for solder joints has been developed. The analytic results show that for a temperature cyclic test, long high-temperature and low-temperature dwell times do not contribute to the cyclic strain range in solder joint so much. Based upon the results of the strain analyzes, some efficient testing processes of temperature cycling and mechanical fatigue experiments for the microelectronics solder joint were proposed, and the cycling tests were carried out. The experimental results show a good agreement with the analytic results. The proposed thermal cyclic accelerated test method can save over 50% testing time than an usual methods, and the experimental results showed that the proposed mechanical fatigue test method can be used as a good accelerated test method for the thermal fatigue strength of solder joints. It was shown that the fatigue life of TSOP and BGA solder joints could be estimated by Manson-Coffin's low as N_f=A DELTAepsilon_<in>^n. Further more a CAE system for fatigue strength estimation of solder joints has been developed based upon the statistical optimization method (SOM) and experimental results. It was shown that SOM could be used as a very practical tool to conduct fatigue design of solder joints. The fatigue life of BGA solder joints subjected to operating conditions was estimated, and the results showed that the fatigue life is greatly affected by not only the temperature changing range but also by the mean temperature. In the CAE system, a mathematical programming (successive quadratic programing) was employed to solve the optimization problem of the weight of solder joints.
为了研究微电子焊点在温度循环试验过程中的应力-应变循环滞后现象,建立了TSOP、BGA和LCCC的有限元模型,开发了焊点应力-应变评估系统。分析结果表明,对于温度循环试验,较长的高温和低温停留时间对焊点的循环应变范围的贡献不大。根据应变分析结果,提出了微电子焊点温度循环和机械疲劳试验的有效测试方法,并进行了循环试验。实验结果与分析结果吻合较好。试验结果表明,该机械疲劳试验方法可以作为焊点热疲劳强度的一种良好的加速试验方法。结果表明,TSOP和BGA焊点的疲劳寿命可以用Manson-Coffin公式N_f=A来估算,并基于统计优化方法和实验结果开发了焊点疲劳强度的CAE系统。结果表明,SOM可以作为一种非常实用的工具进行焊点的疲劳设计。对运行条件下BGA焊点的疲劳寿命进行了估算,结果表明,BGA焊点的疲劳寿命不仅受温度变化范围的影响较大,而且受平均温度的影响也较大。在CAE系统中,采用了数学规划(逐次二次规划)方法来解决焊点重量的优化问题。
项目成果
期刊论文数量(25)
专著数量(0)
科研奖励数量(0)
会议论文数量(0)
专利数量(0)
王樹波: "表面実装部品はんだ接合部の弾塑性-クリープ有限要素解析法に関する研究" 日本機械学会論文集. 62. 527-532 (1996)
王树波:“表面贴装元件焊点弹塑性蠕变有限元分析研究”日本机械工程学会会刊 62. 527-532 (1996)。
- DOI:
- 发表时间:
- 期刊:
- 影响因子:0
- 作者:
- 通讯作者:
Qiang Yu: "A Study of Mechanical and Thermal Stress behavior due to Global and Local Thermal Mismatch of Dissimilar Materials in Electronic Packaging." Advances in Electronic Packaging, ASME. EEP-Vol 10-1. 389-394 (1995)
于强:“电子封装中异种材料全局和局部热失配导致的机械和热应力行为的研究”。
- DOI:
- 发表时间:
- 期刊:
- 影响因子:0
- 作者:
- 通讯作者:
M. Shiratori: "A Computational and Experimental Hybrid Approach to Creep Fatigue Behavior of Surface-Mounted Solder Joints" Advances in Electronic Packaging, ASME. EEP-Vol. 10-1. 451-457 (1995)
M. Shiratori:“表面安装焊点蠕变疲劳行为的计算和实验混合方法”电子封装进展,ASME。
- DOI:
- 发表时间:
- 期刊:
- 影响因子:0
- 作者:
- 通讯作者:
Takayoshi Kashiwamura: "Structural Optimization Using the Design of Experiments and Mathematical Programming" Trans.of JSME (A). 62-601. 2180-2185 (1996)
Takayoshi Kashiwamura:“使用实验设计和数学编程进行结构优化”Trans.of JSME (A)。
- DOI:
- 发表时间:
- 期刊:
- 影响因子:0
- 作者:
- 通讯作者:
M.Shiratori: "A Computational and Experimental Hybrid Approach to Creep Eatigue Behavior of Surface-Mounted Solder Joints" Advances in Electronic Packaging, ASME. EEP-Vol.10-1. 451-457 (1995)
M.Shiratori:“表面安装焊点蠕变行为的计算和实验混合方法”电子封装进展,ASME。
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- 期刊:
- 影响因子:0
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SHIRATORI Masaki其他文献
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07555028 - 财政年份:1995
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Grant-in-Aid for Scientific Research (A)
STRENGTH EVALUATION OF THERMAL CYCLING FATIGUE FOR SURFACE-MOUNDED SOLDER JOINTS
表面贴装焊点热循环疲劳强度评估
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05555031 - 财政年份:1993
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