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Development of a superior PS-PDI(Phase-Shifting Point Diffraction Interferometer) for Absolute Shape Measurement of Large-Diameter Surfaces

Development of a superior PS-PDI(Phase-Shifting Point Diffraction Interferometer) for Absolute Shape Measurement of Large-Diameter Surfaces
开发用于大直径表面绝对形状测量的优质 PS-PDI(移相点衍射干涉仪)
批准号:
13555034
负责人:
KATAOKA Toshihiko
金额:
$8.45万
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
2001
资助国家:
日本
项目状态:
已结题
起止时间:
2001 至 2003

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中文摘要
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英文摘要
We have developed a novel phase-shifting interferometer using a spherical wavefront, as a reference surface, come out from single-mode optical fibers. This interferometer measures an absolute shape of a distorted spherical wavefront which reflected from a sample concave mirror by using another spherical wavefront. Accuracy of the spherical wavefront is estimated to be below 10^-5-6λ. In principle, this interferometer can perform an extremely accurate measurement of concave surfaces. A key factor for the development was a low-frequency vibration of the system. The effect of the vibration restricted by accepting both phase control system in light source side and an air suspension type table. As a result, a large concave mirror(200mm diameter, 1500mm radius of curvature) was measures by this system. With a newly developed data processing program which can eliminate a systematic error caused by the optical configuration of the interferometer, the absolute shape of the mirror surface was measured with a repeatability of +/-18nmPV.
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井上, 片岡他: "レーザ光散乱法によるSiウエハ表面上の超微小欠陥計測"精密工学会誌. 68. 1337-1341 (2002)
Inoue, Kataoka 等人:“使用激光散射法测量硅晶片表面的超细缺陷”日本精密工程学会杂志 68. 1337-1341 (2002)。
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押鐘, 片岡, 遠藤, 井上, 玄羽, 宮本: "3次元境界要素法を用いた走査型近接場光学顕微鏡用の微粒子プローブ周りの電磁場伝搬解析"2001年度精密工学会秋季大会学術講演会講演論文集. 208-208 (2001)
Oshikane、Kataoka、Endo、Inoue、Genba、Miyamoto:“使用三维边界元法扫描近场光学显微镜的粒子探针周围的电磁场传播分析”2001年日本精密工程学会秋季会议学术会议论文集208-208(2001)
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押鐘, 南, 片岡, 中野, 井上: "点光源回折球面波を計測基準とした位相シフト光干渉計に開発-ズーミング計測による横分解能の向上-"2003年度精密工学会 秋季大会 学術講演会講演論文集. B75 (2003)
Oshikane、Minami、Kataoka、Nakano、Inoue:“使用点光源衍射球面波作为测量标准的相移光学干涉仪的开发-通过变焦测量提高横向分辨率-”2003年日本精密工程学会秋季会议学术会议讲座论文集。B75 (2003)
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17
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    • 批准号:
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    • 项目类别:
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    • 资助金额:
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    • 项目类别:
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    • 资助金额:
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    • 批准号:
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