Application of optical near-field excited with ultra fast laser pulses to microfabrication
Application of optical near-field excited with ultra fast laser pulses to microfabrication
批准号:
11450030
负责人:
KATAOKA Toshihiko
金额:
$9.73万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
1999
资助国家:
日本
项目状态:
已结题
起止时间:
1999 至 2001
中文摘要
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英文摘要
Aim of this research is the application of localized optical near-field excited with ultra fast laser pulses to micro fabrication. Then we have designed and developed a simple novel Scanning Near-field Optical Microscope (SNOM) system in both hardware and software. The followings are the summaries of this study.A conventional optical microscope may construct a half-wavelength size of the focused light spot in the view area because of the optical diffraction limit. But the SNOM could achieve high spatial resolution far below the diffraction limit by using of optical near-field on the surface of the objects. And the studies of optical near-field could allow us to design a functional probe for near-field application.Our SNOM system adopts a micro protrusion created on the surface of pyramidal glass substrate as a SNOM probe. This probe is illuminated by ultramicroscopic technique.The characteristic of the probe is numerically studied with three dimensional boundary element method (3D-BEM) … More program applied for electromagnetic field. The results show the ideal parameters of the probe configuration for high spatial resolution, and the angular distribution of the light scattering around the probe. The dependence of the scattering light on probe-sample distance is calculated and compared with the experimental results.The intensity of the optical near-field is proportional to the difference of electro susceptibility between probe and sample. For instance, a pair of dielectric probe and metal sample may achieve good result.The following is a summary of the design and development of the SNOM system. Probe holding ---> XY translational stage sample stag ---> goniometer inchworm powe supply ---> high response, low ripple noise AD, DA, DIO board ---> high response, high resolution system software---> easy operation, easy developmentAs a result, the SNOM system scans the sample surface by digital feedback software which controls the extension of piezo actuator with PMT signal.This SNOM system tried to scan the surface of optical grating with five-micron polystyrene sphere probe. The scanned image agreed with the optical microscopic image of the grating, and the image reproducibility was good. The spatial resolution of the image was below one micron.Then we have tried to make sub-micron protrusion for the SNOM probe by multiphoton processes excited with femto-second laser pulses focused in ultraviolet resins. We made a protrusion which size is comparable to the laser spot size. But we have not created the probe which has been designed with our 3D-BEM simulation yet. We will develop nano fabrication system for the realization of nano-probe. Less
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Haruyuki Inoue, Toshihiko Kataoka, Katsuyoshi Endo, Yasushi Oshikane, Yuzo Mori, Motohiro Nakano, Hiroshi An, Taichi Takemura, and Katsuo Wada: "Inspection of ultra fine particles on the Si wafer surface using laser light scattering method"Japanese J. of
Haruyuki Inoue、Toshihiko Kataoka、Katsuyoshi Endo、Yasushi Oshikane、Yuzo Mori、Motohiro Nakano、Hiroshi An、Taichi Takemura 和 Katsuo Wada:“使用激光散射法检查 Si 晶片表面上的超细颗粒”Japan J. of
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Yasushi Oshikane, Toshihiko Kataoka, Katsuyoshi Endo, Haruyuki Inoue, Tetsuta Genba, and Yosuke Miyamoto: "Electromagnetic analysis of optical near-field around single protrusion probe for scanning near-field optical microscope by three dimensional bounda
Yasushi Oshikane、Toshihiko Kataoka、Katsuyoshi Endo、Haruyuki Inoue、Tetsuta Genba 和 Yosuke Miyamoto:“通过三维边界扫描近场光学显微镜的单突出探针周围光学近场的电磁分析
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井上, 片岡, 遠藤, 押鐘, 森, 中野, 安, 竹村, 和田: "レーザ光散乱法によるSiウエハ付着超微粒子計測"精密工学会誌. vol.68,No.2. 264-268 (2002)
Inoue、Kataoka、Endo、Oshikane、Mori、Nakano、Yasu、Takemura、Wada:“使用激光散射法测量附着在硅晶片上的超细颗粒”日本精密工程学会杂志第 68 卷,第 2 期。 264-268 (2002)
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中川 他: "微小共振球プローブを用いた走査型近接場光学顕微鏡の特性"1999年度精密工学会秋季大会学術講演会講演論文集. P75 (1999)
Nakakawa等人:“使用微共振球形探针的扫描近场光学显微镜的特性”1999年日本精密工程学会秋季会议学术会议论文集P75(1999)。
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H.Nakagawa et al.: ""Development of a High Sensitive Probe for Scanning Near-Field Optical Microscope with a Micro Cavity""Proc. Of the 9th ICPE (Osaka,Japan). 905-910 (1999)
H.Nakakawa 等人:“用于扫描微腔近场光学显微镜的高灵敏度探头的开发”Proc。
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共 23 条
Development of Phase-Shifting Point Diffraction Interferometer Assisted by Fiber Optic Window : Highly-Reproducible Absolute Surface Figure Measurement of Large Aperture Aspherical Mirrors
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批准号:19360066
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$13.06万
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财政年份:2007
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负责人:KATAOKA Toshihiko
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依托单位:
Absolute surface figure measurement of aspherical surfaces with diffracted wavefronts as reference waves emitted from two optical fibers
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批准号:16360067
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$8.06万
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财政年份:2004
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负责人:KATAOKA Toshihiko
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依托单位:
Development of a superior PS-PDI(Phase-Shifting Point Diffraction Interferometer) for Absolute Shape Measurement of Large-Diameter Surfaces
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批准号:13555034
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$8.45万
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财政年份:2001
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负责人:KATAOKA Toshihiko
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依托单位:
Spatiotemporal optical emission spectroscopy of atmospheric VHF plasma process
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批准号:08405014
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项目类别:Grant-in-Aid for Scientific Research (A)
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资助金额:$14.85万
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财政年份:1996
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负责人:KATAOKA Toshihiko
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依托单位:
Micro-Machining by Nearfield Optics
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批准号:05555044
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项目类别:Grant-in-Aid for Developmental Scientific Research (B)
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资助金额:$4.35万
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财政年份:1993
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负责人:KATAOKA Toshihiko
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依托单位:
海外基金