Photo-resist. Stripping. Technology. by. Gas-liquid. mixture. for. Highly-efficient. Ultra-short-time. Semiconductor. Manufacturing
Photo-resist. Stripping. Technology. by. Gas-liquid. mixture. for. Highly-efficient. Ultra-short-time. Semiconductor. Manufacturing
批准号:
13555084
负责人:
SUGAWA Shigetoshi
金额:
$8.19万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
2001
资助国家:
日本
项目状态:
已结题
起止时间:
2001 至 2002
中文摘要
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英文摘要
High-performance and ultra-low power consumption PDAs as a degital-network-communication tool is strongly required in the grobal-network-information society. In such tool, large-scale integrated system which can catch up with changing cutstomer needs day by day is essencial, and therefore ultra-short-time semiconductor manufacturing is required. In this study, ultra-short-time and highly efficient photo-resist stripping technology which can drastically improve semiconductor manufacturing efficiency is established.AT first, we have developed a experimental equipment, featuring the ability to hange a injection speed, injection quantity, injection pressure of gas-liquid mixture, substrate movement speed, inozzle movement speed an so on. With this equipment, we have optimized such parameters and obtained that the photo-resiston 8 inch wafer can be stripped only in one minute, nevertheless the arsenic ions implantation (10E16 atoms/cm2) have been taken to the photo-resisit, which cannot be stripped easily even if O2 plasma ashing Followed by the chemical cleaning with the 4:1 mixture of 98% H2SO4 and 30% H2O2 have been done.Moreover, in order to shorten the processing time, we have imvestiated the pre-treatment process Followed by the treatment by the gas-liquid mixture. As a result, we have obtained that the O3-added ultrapure-water treatment with pH control by CO2 addition can effectively remove the photo-resist.As mentioned above, we have established the foundation for the short-time photo-resist stripping technology for highly efficient and ultra-short-time semiconductor manufacturing.
期刊论文(6)
专著(0)
科研奖励(0)
会议论文
大見 忠弘: "ウェットサイエンスが築くプロダクトイノベーション"サイペック(株)RIALIZE事業部門. 295 (2001)
近江忠宏:“湿科学构建的产品创新”CYPEC Co., Ltd. RIALIZE 事业部 295 (2001)
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通讯作者:
Tadahiro Ohmi: "Product Innovation by Wet-chemical Science"Sipec Inc. Realize Division. 295(total pages) (2001)
Tadahiro Ohmi:“湿化学科学的产品创新”Sipec Inc.实现部门。
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通讯作者:
T.Ohkawa, Y.Wakayama, S.Kobayashi, S.Sugawa, H.Aharoni, T.Ohmi: "The Effect of Organic Contaminations Molecular Weights in the Cleanroom Air on MOS Devices Degradation- a Controlled Laminar Air Flow Experiment"Extend Abstracts of the 2001 International Co
T.Ohkawa、Y.Wakayama、S.Kobayashi、S.Sukawa、H.Aharoni、T.Ohmi:“洁净室空气中有机污染物分子量对 MOS 器件退化的影响 - 受控层流气流实验”扩展摘要
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Accurate measurement and statistical analysis of gate leakage current of MOSFETs with atomically flat interface
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批准号:24360129
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$12.15万
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财政年份:2012
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负责人:SUGAWA Shigetoshi
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依托单位:
A high performance CMOS image sensor with high sensitivity and wide dynamic range
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批准号:19360151
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$12.15万
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财政年份:2007
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负责人:SUGAWA Shigetoshi
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依托单位:
An over-100dB wide dynamic range solid-state image sensor with high sensitivity and high S/N ratio.
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批准号:16360165
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$9.66万
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财政年份:2004
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负责人:SUGAWA Shigetoshi
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依托单位:
Highly Sesitive and High-resolution Amplification Solid-State Imagine System with Instant Imaging Parareli Processor
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批准号:13305024
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项目类别:Grant-in-Aid for Scientific Research (A)
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资助金额:$32.7万
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财政年份:2001
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负责人:SUGAWA Shigetoshi
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依托单位: