Development of Atomically Controlled Plasma Processing for GroupIV Quantum Device Fabrication
Development of Atomically Controlled Plasma Processing for GroupIV Quantum Device Fabrication
批准号:
18063001
负责人:
SAKURABA Masao
金额:
$26.37万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research on Priority Areas
财政年份:
2006
资助国家:
日本
项目状态:
已结题
起止时间:
2006 至 2009
中文摘要
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英文摘要
By utilizing surface reaction of reactant gases under ECR Ar plasma irradiation without substrate heating, epitaxial growth of atomically flat highly strained films of Ge and Si as well as B atomic-layer doped Si were demonstrated. Moreover, by lowering of the plasma energy in the epitaxial growth, it was clarified that plasma damage and surface B reduction by Ar plasma irradiation can be effectively suppressed and it is quite important to increase of strain and B concentration in the B atomic-layer doped films.
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Very Low-Temperature Epitaxial Growth of Silicon and Germanium Using Plasma-Assisted CVD (Invited Paper)
使用等离子体辅助 CVD 进行硅和锗的极低温外延生长(特邀论文)
DOI:
--
发表时间:
2007
期刊:
影响因子:
--
作者:
[M. Sakuraba, D. Muto, M. Mori, K. Sugawara, J. Murota]
通讯作者:
J. Murota
Epitaxial Growth of Group IV Semiconductor Nanostructures Using Atomically Controlled Plasma Processing (Invited Paper)
使用原子控制等离子体处理的 IV 族半导体纳米结构的外延生长(特邀论文)
DOI:
--
发表时间:
2010
期刊:
影响因子:
--
作者:
[M. Sakuraba、T. Nosaka、K. Sugawara, J. Murota]
通讯作者:
J. Murota
Hole tunneling properties in resonant tunneling diodes with Si/Strained Si0. 8Ge0. 2 heterostructures grown on Si(100) by low-temperature ultraclean LPCVD
Si/应变 Si0 谐振隧道二极管的空穴隧道特性。
DOI:
--
发表时间:
2007
期刊:
Semicond. Sci. Technol Vol.22
影响因子:
--
作者:
[R. Ito, M. Sakuraba, J. Murota]
通讯作者:
J. Murota
Fabrication of Hole Resonant Tunneling Diodes Utilizing Nanometer-Order Strained SiGe / Si (100) Heterostructures with High Ge Fraction
利用高 Ge 分数纳米级应变 SiGe/Si (100) 异质结构制造空穴谐振隧道二极管
DOI:
--
发表时间:
2008
期刊:
影响因子:
--
作者:
[寺本章伸, 荒谷崇, 樋口正顕, 池永英司, 平山昌樹, 須川成利, 服部健雄, 大見忠弘, 柿本浩一, M. Sakuraba]
通讯作者:
M. Sakuraba
Highly Strained-Si/Relaxed-Ge Epitaxial Growth on Si(100) by ECR Plasma CVD and Evaluation of Thermal Stability
利用 ECR 等离子体 CVD 在 Si(100) 上进行高应变 Si/松弛 Ge 外延生长及热稳定性评价
DOI:
--
发表时间:
2006
期刊:
Abstracts of 2nd Int. Workshop on New Group IV Semiconductor Nanoelectronics (Tohoku Univ., Sendai, Japan, Oct. 2-3, 2006)
影响因子:
--
作者:
[Y, Morita・S, Akine・T, Nabeshima, Toshikazu Takata, K.Sugawara et al.]
通讯作者:
K.Sugawara et al.
共 33 条
Process development for high-performance highly-strained quantum-heterostructure resonant-tunneling devices of group-IV semiconductors
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批准号:23360003
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$13.06万
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财政年份:2011
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负责人:SAKURABA Masao
-
依托单位:
Group IV Semiconductor Quantum Device Fabrication for Room Temperature Operation
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批准号:19360002
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$11.81万
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财政年份:2007
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负责人:SAKURABA Masao
-
依托单位:
Electronicband modulation and formation of quantum tunneling structures by atomic-layer control of group-IV semiconductors
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批准号:16360002
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$9.41万
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财政年份:2004
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负责人:SAKURABA Masao
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依托单位:
Fabrication of Resonant Tunneling Diode by Atomic Layer-by-Layer Epitaxial Growth of Si-Ge-C-N System
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批准号:12450001
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$8.19万
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财政年份:2000
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负责人:SAKURABA Masao
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依托单位:
海外基金