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Electronicband modulation and formation of quantum tunneling structures by atomic-layer control of group-IV semiconductors

Electronicband modulation and formation of quantum tunneling structures by atomic-layer control of group-IV semiconductors
通过 IV 族半导体的原子层控制电子带调制和量子隧道结构的形成
批准号:
16360002
负责人:
SAKURABA Masao
金额:
$9.41万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
2004
资助国家:
日本
项目状态:
已结题
起止时间:
2004 至 2006

项目摘要

项目成果

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中文摘要
翻译
本项目的目的是通过对IV族半导体的原子层控制和引入原子级异质结构,研究电子能带调制和量子隧穿结构的形成,以阐明载流子传输/产生/复合过程的新特性,并创造新型电子能带调制半导体。利用B_2H_6和PH_3在Si、Si_<1-x>Ge_x和Ge表面上的表面反应,在抑制混合和孤岛效应的条件下,找到了形成B和P原子层的条件。此外,研究发现,采用Si_2H_6作为反应性比SiH_4更强的反应气体,可以有效地抑制P吸附Si(100)上盖层生长过程中的P偏聚,并使许多P原子进入厚度小于2nm的界面薄膜区域,最大P浓度为3 × 10 ~(-4)<21>cm ~ 2<-3>(原子比6%)。此外,还发现这种P原子层掺杂结构比传统的均匀P掺杂Si显示出更高的霍尔迁移率。通过使用ECR等离子体CVD而不加热衬底,实现了在Si和Ge的(100)表面上具有原子级平坦度的高应变Ge和Si外延生长,并且显示了高应变IV族半导体异质结构的可能性(这是通过常规热CVD工艺难以实现的)。为了获得更高性能的p型共振隧穿二极管,通过研究高质量Si_<1-x>Ge_x/Si异质结外延生长的新条件,得出了增加异质结中Ge含量对达到室温工作是相当有效的结论。这些结果对制备新型电子带调制半导体材料具有重要意义。
英文摘要
Purpose of this project is, by atomic-layer control of group-IV semiconductors and introduction of atomic-order heterostructures, investigation of electronic-band modulation and formation of quantum tunneling structures in order to clarify new properties of carrier transport/generation/recombination processes and creation of novel electronic-band modulated semiconductors. Utilizing surface reactions of B_2H_6 and PH_3 on Si,Si_<1-x>Ge_x and Ge surfaces, conditions for atomic-layer formation of B and P were found under suppression of intermixing and islanding at low temperatures. Additionally, it was found that, by using Si_2H_6 as a more reactive reactant gas than SiH_4,P segregation during capping Si layer growth on a P adsorbed Si(100) could be effectively suppressed and many of P atoms were incorporated in a thin film region at the interface with the thickness below 2 nm and the maximum P concentration of 3x10^<21> cm^<-3>(atomic ratio 6%). Moreover, it was also found that such P atomic-layer doped structures showed higher Hall mobility than the conventional uniformly P doped Si. By using ECR plasma CVD without substrate heating, highly strained Ge and Si epitaxial growth on a (100) surface of Si and Ge with atomic-order flatness was achieved, and possibility of highly strained group-IV semiconductor heterostructures was shown (which was difficult to be achieved by conventional thermal CVD processes). In order to achieve higher-performance p-type resonant tunneling diodes, by investigating new conditions for epitaxial growth of high quality Si_<1-x>Ge_x/Si heterostructures, it is concluded that increase of Ge fraction in the heterostructure is quite effective to reach room temperature operation. These results are very useful to create novel electronic-band modulated semiconductors.
期刊论文(44)
专著(0)
科研奖励(0)
会议论文
Strain and Conductivity Behavior of Stripe Patterned Si/Si_<1-x>Ge_x/Si(100) Heterostructures
条纹图案Si/Si_<1-x>Ge_x/Si(100)异质结构的应变和电导行为
DOI: --
发表时间: 2006
期刊: Abstracts of 2nd Int. Workshop on New Group IV Semiconductor Nanoelectronics (Tohoku Univ., Sendai, Japan, Oct. 2-3, 2006)
影响因子: --
作者: [J.Uhm, et al., H.Shim et al., K.Sugawara et al., H.-S.Cho et al., A.Yamada et al., J.Murota et al., J.Uhm et al.]
通讯作者: J.Uhm et al.
Electrical Characteristics of Hole Resonant Tunneling Diodes with High Ge Fraction Si/Strained Si_<1-x>Ge_x Heterostructures on Si(100) Grown by Low-Temperature Ultraclean LPCVD
低温超净LPCVD在Si(100)上生长的高Ge分数Si/应变Si_<1-x>Ge_x异质结构空穴谐振隧道二极管的电学特性
DOI: --
发表时间: 2006
期刊: Abstracts of 2nd Int. Workshop on New Group IV Semiconductor Nanoelectronics (Tohoku Univ., Sendai, Japan, Oct. 2-3, 2006)
影响因子: --
作者: [T.Seo, et al.]
通讯作者: et al.
Fabrication of 0.12-μm pMOSFETs on High Ge Fraction Si/Si_<1-x>Ge_x/Si(100) heterostructure with Ultrashallow Source/Drain Formed using B-Doped SiGe CVD
使用 B 掺杂 SiGe CVD 在高 Ge 分数 Si/Si_<1-x>Ge_x/Si(100) 异质结构上制造具有超浅源极/漏极的 0.12-μm pMOSFET
DOI: --
发表时间: 2004
期刊: Appl.Surf.Sci. Vol.224
影响因子: --
作者: [D.Lee, S.Takehiro, M.Sakuraba, J.Murota, T.Tsuchiya]
通讯作者: T.Tsuchiya
Carbon doping effect on strain relaxation during Si_<1-x-y>Ge_xC_y epitaxial growth on Si(100) at 500℃,
碳掺杂对500℃ Si(100)上Si_<1-x-y>Ge_xC_y外延生长应变弛豫的影响,
DOI: --
发表时间: 2007
期刊: Semicond.Sci.Technol. Vol.22
影响因子: --
作者: [H.Kaj, T.Yamada, N.Tsukamoto, F.Horii, J.Uhm et al., K.Sugawara et al., H.Nitta et al.]
通讯作者: H.Nitta et al.
26
    Process development for high-performance highly-strained quantum-heterostructure resonant-tunneling devices of group-IV semiconductors
    • 批准号:
      23360003
    • 项目类别:
      Grant-in-Aid for Scientific Research (B)
    • 资助金额:
      $13.06万
    • 财政年份:
      2011
    • 负责人:
      SAKURABA Masao
    • 依托单位:
    Group IV Semiconductor Quantum Device Fabrication for Room Temperature Operation
    • 批准号:
      19360002
    • 项目类别:
      Grant-in-Aid for Scientific Research (B)
    • 资助金额:
      $11.81万
    • 财政年份:
      2007
    • 负责人:
      SAKURABA Masao
    • 依托单位:
    Development of Atomically Controlled Plasma Processing for GroupIV Quantum Device Fabrication
    • 批准号:
      18063001
    • 项目类别:
      Grant-in-Aid for Scientific Research on Priority Areas
    • 资助金额:
      $26.37万
    • 财政年份:
      2006
    • 负责人:
      SAKURABA Masao
    • 依托单位:
    Fabrication of Resonant Tunneling Diode by Atomic Layer-by-Layer Epitaxial Growth of Si-Ge-C-N System
    • 批准号:
      12450001
    • 项目类别:
      Grant-in-Aid for Scientific Research (B)
    • 资助金额:
      $8.19万
    • 财政年份:
      2000
    • 负责人:
      SAKURABA Masao
    • 依托单位:
    海外基金