Mischungsverhalten von binären Flüssigkeiten: Kritisches Verhalten in dünnen Filmen

两种或多种液体的混合行为是一个令人兴奋的问题，在过去的20年里引起了极大的关注。然而，迄今为止，大多数研究都是理论工作，只有少数定量实验已经进行。我们建议在我们的项目中的X射线和中子反射率和漫散射测量，以获得密度分布和信息的横向波动的二元混合物旁边的基板，并在其近表面区域。该项目的第一部分涉及通过X射线反射率确定密度分布。在过去和以前的项目中已经表明，X射线反射率非常适合于确定埃尺度上的液体膜的密度分布。第一个非常有希望的实验已经进行了。在第二部分中，我们计划集中在“临界吸附”的特殊主题，在接近临界点的系统中，一个物种相对于另一个相邻的墙富集是预期的。详细计算的密度分布存在于文献中，将通过X射线和中子反射率测量进行测试。

The mixing behavior of two or more liquids is an exciting problem which has attracted great attention within the past 20 years. However, most of the studies are theoretical works and only a few quantitative experiments have been carried out so far. We propose in our project x-ray and neutron reflectivity and diffuse scattering measurements to obtain density profiles and information about lateral fluctuations of binary mixtures next to a substrate and in their near surface regions. The first part of the project deals with the determination of density profiles by x-ray reflectivity. It has been shown in the past and the previous project that x-ray reflectivity is very well suited to determine density profiles of liquid films on an angstrom scale. First very promising experiments have already been carried out.In the second part we plan to focus on the special topic of "critical adsorption" where close to the critical point of the system an enrichment of one species with respect to the other next to a wall is expected. Detailed calculated density profiles exist in the literature which will be tested by x-ray and neutron reflectivity measurements.