Numerical Data Treatments and Analysis of Two-dimensional X-ray Scattering Patterns

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An analytical system working on personal computers was developed to treat numerical data of X-ray diffraction patterns measured with a planar and a cylindrical image-plate detectors. The most striking feature is that the polymer fiber samples are not necessarily oriented to be normal to the incident X-ray beam. The geometry of sample orientation can be defined with the aid of the positions of reflections. Data collection including calculations of reciprocal-lattice coordinates, background separation, Lorentz and other essential corrections, and peak detection are processed for the inclined geometry.For uniaxially-oriented polymer samples, the meridional reflections exist in a sort of singular position, and therefore their intensity data have not been collected for the crystal structure analysis. This singularity problem is resolved in the present system. If the oriented sample were just tilted so as to give a certain meridional reflection, its integral intensity corrected for the Lorentz factor is obtained accurately without the conventional singularity on meridians. The radial, azimuthal, and layer-line intensity distributions are extracted, and served to analyze the degree of orientation, crystallinity, and disorders involved in the crystallites. This system was applied for analyses of poly(p-phenylene sulfide) and poly(L-lactic acid), π-conjugated electro-conductive polymers, and comb-like polymers.