课题基金 / 基金详情

ULTRA-LOW-POWER SILICON LSI DESIGN BASED ON Eb/No-BER CHARACTERISTICS

ULTRA-LOW-POWER SILICON LSI DESIGN BASED ON Eb/No-BER CHARACTERISTICS
基于 Eb/No-BER 特性的超低功耗硅 LSI 设计
批准号:
08405027
负责人:
MASU Kazuya
金额:
$26.43万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (A)
财政年份:
1996
资助国家:
日本
项目状态:
已结题
起止时间:
1996 至 1999

项目摘要

项目成果

MASU Kazuya的其他基金

相关文献

中文摘要
翻译
本研究项目的目的是在“Eb/No-BER特性”的基础上,为纳米级器件的超低功耗设计奠定基础。制作了硅CMOS测试芯片,并首次对其Eb/No-BER特性进行了评价。根据测量结果,提出了适用于小型化CMOS电路的最小供电电压。此外,还对线路互连间的串扰噪声进行了估计。将“Eb/No-BER特性”应用于单电子晶体管(SET)的设计。根据仿真结果,提出了基于“Eb/No-BER特性”的外围寄生电容和互连布局作为纳米级器件的指导原则。从室温运行的角度研究了互补SET (CSET)逆变电路。从“Eb/No-BER特性”来看,室温CSET在现代制造技术下很难实现。从信噪比恢复的概念出发,首次提出了一种新型匹配滤波器CSET来代替普通的CSET。在室温条件下对由3片匹配滤波器组成的CSET进行了测试。虽然匹配滤波器类型CSET已被证明是有效的信噪比恢复,但发现总功耗上升。毕竟,从“Eb/No-BER特性”可以确定SET电路适用于低温工作。此外,还提出并研究了下一代超高速大容量公交线路。我们相信上述研究成果符合下一代超低功耗高速ULSI电路设计的要求。
英文摘要
The purpose of this research project is to establish the basis of ultra low power design of nano-scale devices on the basis of "Eb/No-BER characteristics."1. Silicon CMOS test chips have been fabricated and their Eb/No-BER characteristics have been evaluated for the first time. Base on the measurement results, the minimum supply voltage for miniaturized CMOS circuits is proposed. Furthermore, cross-talk noises among the wiring interconnects have been estimated.2. "Eb/No-BER characteristics" was applied to a design of single electron transistors (SET). From simulation results, peripheral parasitic capacitance and interconnect layout have been proposed as a guiding principle of nano-scale devices based on the "Eb/No-BER characteristics".3. Complementary SET (CSET) inverter circuits were investigated from the viewpoint of room temperature operation. From the "Eb/No-BER characteristics", it has been found that room-temperature CSET is hardly implemented under up-to-date manufacturing technology.4. Instead of normal CSET, novel matched filter type CSET has been proposed for the first time from a concept of S/N recovery. CSET which consists of 3chip matched filter has been evaluated at room temperature. Although matched filter type CSET has been proved to be effective for S/N recovery, total power consumption is found to go up. After all, it is confirmed from the "Eb/No-BER characteristics" that SET circuits is applicable to low-temperature operation.Furthermore, ultra high-speed high-capacity bus lines for the next generation have been proposed and investigated.We believe that the above achievements of this research fulfill the requirements for the next generation ultra low-power high-speed ULSI circuits design.
期刊论文(31)
专著(0)
科研奖励(0)
会议论文
島野 哲: "Eb/NO-BER特性によるSET回路信頼性の評価" 第59回応用物理学会学術講演会予稿集. 58. 17pZK14 (1998)
Satoshi Shimano:“使用 Eb/NO-BER 特性评估 SET 电路可靠性”日本应用物理学会第 59 届年会论文集 58. 17pZK14 (1998)。
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S.Shimano: "Reliability of Single Electron Transistor Circuits Based onEb/No-BER Characteristics"Jpn.J.Appl.Phys.. 38(1B). 403-405 (1999)
S.Shimano:“基于 Eb/No-BER 特性的单电子晶体管电路的可靠性”Jpn.J.Appl.Phys.. 38(1B)。
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通讯作者:
K. Masu: "ULSI GHz Interconnect"Silicon technology symposium, Japan Applied Physics. (2000)
K. Masu:“ULSI GHz 互连”硅技术研讨会,日本应用物理。
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K. Masu: "A Novel Guiding Principle to Low Power ULSI Design : From the System Error Evaluation of Eb/No-BER" IEEE Electron Device Letters, to be subnitted. (1996)
K. Masu:“低功耗 ULSI 设计的新颖指导原则:来自 Eb/No-BER 的系统误差评估”IEEE Electron Device Letters,待提交。
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31
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