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Selective area formation and optical device application of Si islands by thermal agglomeration of SOI layers

Selective area formation and optical device application of Si islands by thermal agglomeration of SOI layers
SOI层热团聚硅岛的选择性区域形成及光学器件应用
批准号:
13650011
负责人:
ISHIKAWA Yasuhiko
金额:
$2.11万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (C)
财政年份:
2001
资助国家:
日本
项目状态:
已结题
起止时间:
2001 至 2003

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ISHIKAWA Yasuhiko的其他基金

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中文摘要
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英文摘要
In this work, thermal agglomeration of line-patterned SOI (silicon-on-insulator) structures (SOI waveguides) was studied in order to form one-dimensional periodic structure for the application to optical devices such as channel dropping filters.Selective area formation of Si islands was realized using the spatial modulation of initial SOT layer. Partial passivation with thermally grown SiO_2 was also found to be effective for the selective area islanding.As for the islanding of SOI line structures, effect of line width, SOI thickness, in-plane crystalline direction of the line pattern and fabrication process (local oxidation of Si or wet etching) was studied. As a result, annealing the SOI line structure having submicron width and thickness of 〜3 nm by the local oxidation technique was found to be deformed into island arrays aligned along two edges of line pattern with the residual Si layer between the arrays. Reflecting the fact that the alignment occurs independent of the in-plane crystalline direction of line pattern, island alignment along the line edges is maintained at 90^O-bend and T-branch of the pattern. This island array can be applied to the multiple-tunnel-junction array, since the island size is as small as 50 nm and the residual Si layer connects the islands as the tunnel capacitors.When the larger width/thickness of line pattern is prepared or when the wet etching process is used in the fabrication, the regular array is not formed. 7-nm-thick SOI layer is required for the fabrication of Si islands with the diameter of 〜100 nm, which is effective for photonic crystal applications, but in this case, the island is not aligned. Further study is necessary in this point.
期刊论文(16)
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会议论文
K. Sawada, M. Tabe, Y. Ishikawa, M. Ishida: "Field Electron Emission Device Using Silicon Nano-Protrusions"Journal of Vacuum Science and Technology B. (掲載決定). (2002)
K. Sawada、M. Tabe、Y. Ishikawa、M. Ishida:“使用硅纳米突出物的场电子发射装置”真空科学与技术杂志 B.(决定出版)。
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Y. Ishikawa, T. Ishihara, M. Iwasaki, M. Tabe: "Negative differential conductance due to resonant tunneling through SiO_2/single-crystalline-Si double barrier structure"Electronics Letters. 37・19. 1200-1201 (2001)
Y. Ishikawa、T. Ishihara、M. Iwasaki、M. Tabe:“通过 SiO_2/单晶硅双势垒结构产生的负微分电导”《电子快报》37・1201 (2001)。
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Y.Ishikawa, M.Kumezawa, Ratno Nuryadi, M.Tabe: "Effect of patterning on thermal agglomeration of ultrathin silicon-on-insulator layer"Applied Surface Science. 190. 11-15 (2002)
Y.Ishikawa、M.Kumezawa、Ratno Nuryadi、M.Tabe:“图案化对超薄绝缘体上硅层热团聚的影响”应用表面科学。
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H.Ikeda, M.Iwasaki, Y.Ishikawa, M.Tabe: "Resonant tunneling characteristics in SiO_2/Si double-barrier structures in a wide range of applied voltage"Applied Physics Letters. 83. 1456-1458 (2003)
H.Ikeda、M.Iwasaki、Y.Ishikawa、M.Tabe:“宽范围施加电压下 SiO_2/Si 双势垒结构的谐振隧道特性”应用物理快报。
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