Nanostructure of exchange spring magnet multilayers examined by resonant X-ray magnetic scattering

通过共振 X 射线磁散射检查交换弹簧磁体多层的纳米结构

• 批准号: 13650721
• 负责人: OKUDA Hiroshi
• 金额: $ 1.98万
• 依托单位: KYOTO UNIVERSITY (2002)Nara Institute of Science and Technology (2001)
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (C)
• 财政年份: 2001
• 资助国家: 日本
• 起止时间: 2001 至 2002
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-13650721/
• 关键词: spring magnet; resonant X-ray magnetic scattering; Reflectivity; circular polarized X-ray; X線磁気散乱; スブリング磁性膜; バーマロイ

Spring magnets comprising of magnetically soft materials such as NiFe films on top of hard materials such as SmCo, exhibits unique magnetization characteristics. The present research aims to examine the twisted magnetic structure appearing in the magnetically soft layers by means of resonant X-ray magnetic scattering measurements.The sample used in the present experiments was grown on Si substrate as SmCo_5(16.5)/Ni_<80>Fe_<20>(60)/SmCo_516.5 nm) trilayers by Molecular Beam Epitaxy(MBE). In-plane magnetic field was applied during the film growth. The direction of applied field was rotated by 90 degree for the top hard layer (SmCo). The magnetization curve of the sample exhibited a two-step magnetization, characteristic of spring magnet structure. Resonant X-ray reflectivity measurements were carried out at beam-line 39XU of Spring 8. The charge contribution of the reflectivity gives a clear Kiessig fringes. The difference reflectivity obtained by the difference in the reflectivity between right and left circularly polarized X-ray near the critical angle, where the preliminary simulation suggest best signal, was well above the statistical variation, but still remain noisy for quantitative analysis. Considering quite small cross section of the magnetic scattering at K edge, much better statistics is required. The present study has shown that the limiting factor in the RMXS measurement is the maximum counting rate of the detector.

弹簧磁体包括软磁性材料，例如在硬材料（例如SmCo）顶部上的NiFe膜，表现出独特的磁化特性。本研究采用分子束外延（MBE）技术在Si衬底上生长SmCo_5（16.5 nm）/Ni_Fe_60/SmCo_5（16.5 nm）三层薄膜，利用共振X射线磁散射测量方法研究了软磁薄膜中出现的扭曲磁结构<80><20>。在薄膜生长过程中施加面内磁场。对于顶部硬层（SmCo），将施加场的方向旋转90度。样品的磁化曲线呈现两级磁化，具有弹簧磁体结构的特征。共振X射线反射率测量在Spring 8的光束线39 XU处进行。反射率的电荷贡献给出了清晰的Kiessig条纹。通过在临界角附近右圆偏振X射线和左圆偏振X射线之间的反射率的差异获得的反射率差异（其中初步模拟表明最佳信号）远高于统计变化，但对于定量分析仍然存在噪声。考虑到K边的磁散射截面很小，需要更好的统计。本研究表明，RMXS测量的限制因素是探测器的最大计数率。

项目成果

橋爪弘雄, 奥田浩司, 細糸信好, 石松直樹: "薄膜磁性をX線で診る"マテリアルズインテグレーション. 41. 72-76 (2001)

Hiroo Hashizume、Koji Okuda、Nobuyoshi Hoito、Naoki Ishimatsu：“用 X 射线检查薄膜磁性”Materials Integration 41. 72-76 (2001)。

橋爪弘雄, 奥田浩司, 細糸信好, 石松直樹: "薄膜磁性をX線で診る"マテリアルズインテグレーション. 14. 72-76 (2001)

Hiroo Hashizume、Koji Okuda、Nobuyoshi Hoito、Naoki Ishimatsu：“用 X 射线检查薄膜磁性”材料集成 14. 72-76 (2001)。

H.Sano, H.Hashizume, Hiroshi Okuda, Nobuyoshi Hosoito: "Oscillatory Resonant X-Ray Magnetic Bragg-Peak Signs and Gd Moments Induced by the Fe/Gd Interlayer Exchange Interaction"Japanese Journal of Applied Physics. 41. 103-106 (2002)

H.Sano、H.Hashizume、Hiroshi Okuda、Nobuyoshi Hosoito：“Fe/Gd 层间交换相互作用引起的振荡共振 X 射线磁布拉格峰征象和 Gd 矩”日本应用物理学杂志。

H.Sano, H.Hashizume, H.Okuda, N.Hosoito: "Oscillatory resonant x-ray magnetic Bragg-peak signs and Gd moments induced by the Fe/Gd interlayer exchange interaction"Jpn.J.Appl.Phys.. 41. 103-106 (2002)

H.Sano、H.Hashizume、H.Okuda、N.Hosoito：“由 Fe/Gd 层间交换相互作用引起的振荡共振 X 射线磁布拉格峰符号和 Gd 矩”Jpn.J.Appl.Phys.. 41

H.Sano, H.Hashizume, H.Okuda, N.Hosoito: "Oscillatory resonant x-ray magnetic Bragg-peak signs and Gd moments induced"Jpn. J. Appl. Phys.. 41. 103-106 (2002)

H.Sano、H.Hashizume、H.Okuda、N.Hosoito：“振荡共振 X 射线磁布拉格峰符号和诱导的 Gd 矩”Jpn。