Atomic resolved imaging of exchange force interaction force by magnetic resonance scanning force microscopy

磁共振扫描力显微镜交换力相互作用力的原子分辨成像

• 批准号: 15310080
• 负责人: MUKASA Koichi
• 金额: $ 10.24万
• 依托单位: Hokkaido University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (B)
• 财政年份: 2003
• 资助国家: 日本
• 起止时间: 2003 至 2005
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-15310080/
• 关键词: Non-contact atomic force microscopy; Atomic force microscopy; scanning probe microscopy; Exchange interaction force; ferromagnetic resonance; Spin measurement; プローブ顕微鏡

We have developed a novel scanning probe microscope (SPM) system which enables to realize magnetic resonance scanning force microscopy (MR-SFM). Up to now, we have succeeded in obtaining an atomic resolved image of Si(111)-7x7 with scanning tunneling microscopy (STM) mode and we confirmed that the developed microscope cell has an adequate rigidity. We composed a optical interferometer system and detected the signal of interferometer between the edge of optical fiber and cantilever. In addition, we confirmed that Q-factor of the cantilever is increasing with falling in temperature. However, the performance of Z-coarse approach (inertial drive) system (production of attocube) is unstable under the ultra high vacuum (10^<-8> Pa) and we have not finished the development of SPM system yet. Since the component exception for the Z-coarse approach behavior, we are sure of that SPM system perform perfectly if Z-coarse approach moves.We developed a new method making a ferromagnetic tip which has the most suitable structure for MR-SFM measurement. This method can gives us the pillar tip which has a ferromagnet on the tip apex. The results of the elements analysis show that the pillar tip includes silicon atoms and that there is a possibility of iron silicides. However, we concluded that the pillar tip is ferromagnetic property because we can obtain the magnetic contrast with a pillar tip by magnetic force microscopy.We performed the experiments for detecting the exchange interaction force between NiO(001) surface and tips and accumulated the experimental knowledge. Form the results of comparison of strength of exchange interaction force between the materials of tip, we concluded that the magnetic property of tip apex is the most important and we need the control of a magnetic property of tip.

我们已经开发了一种新的扫描探针显微镜（SPM）系统，使实现磁共振扫描力显微镜（MR-SFM）。到目前为止，我们已经成功地获得了原子分辨图像的Si（111）-7x7与扫描隧道显微镜（STM）模式，我们证实，开发的显微镜细胞有足够的刚度。我们组成了一套光学干涉仪系统，并在光纤边缘和悬臂梁之间检测干涉仪信号。此外，我们证实了悬臂梁的Q因子随温度的降低而增加。然而，Z-粗接近（惯性驱动）系统（阿托立方体的产生）在超高真空（10^ Pa）下的性能不稳定<-8>，我们还没有完成SPM系统的开发。由于Z-粗接近行为的组件例外，我们可以肯定，如果Z-粗接近移动，SPM系统的性能完美。我们开发了一种新的方法，使铁磁尖端具有最适合的结构，用于MR-SFM测量。这种方法可以得到在针尖顶端有铁磁体的柱状针尖。元素分析结果表明，柱状体尖端含有硅原子，并可能存在铁硅化物。通过磁力显微镜观察到针尖的磁衬度，我们认为针尖是铁磁性的，并进行了NiO（001）表面与针尖之间交换作用力的实验研究，积累了实验知识。通过对针尖材料间交换作用力强度的比较，得出针尖顶端的磁性能是最重要的，需要对针尖的磁性能进行控制。

项目成果

Spin-Polarized Scanning Tunneling Microscopy Study on Charge Ordering of Reconstructed Fe3O4(001) Film Surfaces

自旋偏振扫描隧道显微镜研究重构 Fe3O4(001) 薄膜表面电荷有序性

• 发表时间: 2006
• 期刊: Jpn. J. Appl. Phys. Vol.45
• 作者: T.Takezaki;A.Subagyo;T.Takezaki;A.Subagyo
• 通讯作者: A.Subagyo

Magnetic Field Measurement using Scanning Magnetoresistance Microscope with Spin-Valve Sensor

使用带有旋转阀传感器的扫描磁阻显微镜进行磁场测量

• 发表时间: 2006
• 期刊: Jpn. J. Appl. Phys 45
• 作者: T.Takezaki

Self-Assembled Low-Dimensional Potassium Structures on GaAs(110)

GaAs(110) 上自组装低维钾结构

• 发表时间: 2004
• 期刊: Jpn. J. Appl. Phys 43(7B)
• 作者: T.Takezaki;A.Subagyo;T.Takezaki;A.Subagyo;N.Uehara;T.Takezaki;A.Subagyo;H.Oka;A.Subagyo;A.Subagyo;A.Subagyo;N.Uehara;H.Hosoi;N.Ishida
• 通讯作者: N.Ishida

Reconstruction and Charge Ordering of Epitaxial Fe_3O_4(001) Films

外延Fe_3O_4(001)薄膜的重构和电荷排序

• 发表时间: 2005
• 期刊: J. Magn. Magn. Mater 290-291
• 作者: T.Takezaki;A.Subagyo;T.Takezaki;A.Subagyo;N.Uehara;T.Takezaki;A.Subagyo
• 通讯作者: A.Subagyo

Defect-Induced Charge Freezing on Epitaxial Fe_3O_4(001) Film Surfaces Studied by Spin・Polarized Scanning Tunneling Microscopy

自旋·偏光扫描隧道显微镜研究外延 Fe_3O_4(001) 薄膜表面缺陷诱导电荷冻结

• 发表时间: 2005
• 期刊: Jpn. J. Appl. Phys 44(7B)
• 作者: T.Takezaki;A.Subagyo;T.Takezaki;A.Subagyo;N.Uehara;T.Takezaki;A.Subagyo;H.Oka;A.Subagyo
• 通讯作者: A.Subagyo