Angle Resolved Spectroscopic Observation of Electron Beam induced Radiation from Nano-Structures excited by Low-Energy Electron Nano-probe

低能电子纳米探针激发纳米结构电子束诱导辐射的角分辨光谱观测

• 批准号: 19101004
• 负责人: TAKAYANAGI Kunio
• 金额: $ 67.31万
• 依托单位: Tokyo Institute of Technology
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (S)
• 财政年份: 2007
• 资助国家: 日本
• 起止时间: 2007 至 2011
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-19101004/
• 关键词: 収差補正; 電子顕微鏡; ナノプローブ; ルミネッセンス; 表面プラズモン

Cathodoluminescence detection system has been developed, which enables us to measure the angle-resolved spectrum of emitted light from nano-scale area, when a material is illuminated by an electron probe accelerated by a low voltage. Size of the electron probe reached to sub-nanometer scale at 80 kV by using a scanning transmission electron microscope equipped with a spherical aberration corrector and a newly produced parabolic mirror. Light emission from a gap plasmon antenna formed between a silver nanoparticle and silver surface was observed, and a characteristic dispersion relation of surface plasmon polariton in 1D-and 2D-plasmonic crystals was found in angle-resolved spectral images.

研制了阴极射线发光检测系统，该系统能够测量材料在低电压加速电子探针照射下，纳米尺度区域发射光的角分辨光谱。使用扫描透射电子显微镜，配备了球差校正器和新生产的抛物面反射镜的电子探针的尺寸达到亚纳米级在80 kV。观察到银纳米颗粒和银表面之间形成的间隙等离子体天线的光发射，并且在角分辨光谱图像中发现了一维和二维等离子体晶体中表面等离子体极化激元的特征色散关系。

项目成果

Light Emission of Surface Plasmon Excited by Fast Electrons

快电子激发表面等离子体激元的发光

• 发表时间: 2009
• 作者: Y.Shinohara;et al.;Manabu Kiguchi;N. Yamamoto
• 通讯作者: N. Yamamoto

A Dopant Cluster in a Highly Antimony Doped Si licon Crystal

高锑掺杂硅晶体中的掺杂簇

• 发表时间: 2010
• 期刊: Applied Physics. Expre ss
• 作者: S. Kim;Y. Oshima;H. Sawada;N. Hashikawa;K. Asayama;T. Kaneyama;Y. Kondo;Y. Tanishiro and K. Takayanagi
• 通讯作者: Y. Tanishiro and K. Takayanagi

An effect of probe current on ADF image intensity of Si crystal

探针电流对硅晶体 ADF 图像强度的影响

• 发表时间: 2011
• 作者: S. Kim;Y. Oshima;Y. Tanishiro and K. Takayanagi
• 通讯作者: Y. Tanishiro and K. Takayanagi

Observation of defects in CuInSe2 by 300kV aberration corrected scanning transmission electron microscope

300kV像差校正扫描透射电镜观察CuInSe2缺陷

• 发表时间: 2011
• 作者: A. Takeshita;T. Tanaka;T. Kubota;H. Miyake;H. Sawada;Y. Kondo;Y. Oshima;Y. Tanishiro and K. Takayanagi
• 通讯作者: Y. Tanishiro and K. Takayanagi

Direct Imaging of Lithium Atoms in LiV2O4 by a Spherical Aberration Co rrected Electron Microscope

通过球差校正电子显微镜对 LiV2O4 中的锂原子进行直接成像

• 发表时间: 2010
• 期刊: Journal of Electron M icroscopy
• 作者: Y. Oshima;H. Sawada;F. Hosokawa;E. Okunishi;T. Kaneyama;Y. Kondo;S. Niitaka;H. Takagi;Y. Tanishiro;and K. Takayanagi
• 通讯作者: and K. Takayanagi