Effect of miniaturization of solder joint for electronics packagingon interfacial reaction between solder and substrate and impact reliability of the joint
Effect of miniaturization of solder joint for electronics packagingon interfacial reaction between solder and substrate and impact reliability of the joint
批准号:
22560721
负责人:
NISHIKAWA Hiroshi
金额:
$2.83万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (C)
财政年份:
2010
资助国家:
日本
项目状态:
已结题
起止时间:
2010 至 2012
中文摘要
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英文摘要
As solder bumps become increasingly miniaturized to meet the severdemands of future electronic packaging, it is important to consider whether the solderjoint size and geometry could become reliability issues and thereby affect implementationof the Pb-free solders. In this study, the effect of the solder bump size on the interfacialreaction between the solder and a substrate and the impact reliability using a miniatureimpact tester was investigated. Experimental results suggest that the solder bump sizecan influence the interfacial reaction and the impact reliability of the solder bump.
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Intermetallic Compound Formation andGrowth at the Lead-Free Solder/CuInterface during Laser Reflow Solderingand during Isothermal Aging
激光回流焊接和等温老化过程中无铅焊料/铜界面金属间化合物的形成和生长
DOI:
--
发表时间:
2012
期刊:
影响因子:
--
作者:
[H. Nishikawa, N. Iwata and T. Takemoto]
通讯作者:
N. Iwata and T. Takemoto
低融点はんだ/Cu 継手の耐落下衝撃性評価
低熔点焊料/铜接头的跌落冲击性能评估
DOI:
--
发表时间:
2011
期刊:
影响因子:
--
作者:
[山本晃将, 西川 宏]
通讯作者:
西川 宏
Impact reliability ofmicro-joints soldered with Sn-Ag-Cusolder using laser process
激光工艺锡银铜焊料焊接微接头的冲击可靠性
DOI:
--
发表时间:
2011
期刊:
影响因子:
--
作者:
[H. Nishikawa, N. Iwata and T. Takemoto, 表面技術協会表面技術環境部会編, H. Nishikawa]
通讯作者:
H. Nishikawa
低融点はんだ/Cu継手の耐落下衝撃性評価
低熔点焊料/铜接头的跌落冲击性能评估
DOI:
--
发表时间:
2011
期刊:
影响因子:
--
作者:
[山本晃将, 西川 宏, 山本晃将]
通讯作者:
山本晃将
Investigation of EHL film behavior based on high precision pressure, temperature and film thickness distribution measurement
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批准号:16K06045
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资助金额:$3.08万
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财政年份:2016
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负责人:NISHIKAWA Hiroshi
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依托单位:
Elucidation of the EHL film behavior based on the precise pressure and temperature measurement
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批准号:24560160
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负责人:NISHIKAWA Hiroshi
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依托单位:
Gene expression profiles in endometrial carcinoma
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财政年份:2001
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负责人:NISHIKAWA Hiroshi
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依托单位:
EXPLANATION OF EHL FILM BEHAVIOR UNDER FLUCTUATING LOAD
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项目类别:Grant-in-Aid for Scientific Research (C)
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财政年份:2000
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负责人:NISHIKAWA Hiroshi
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依托单位:
海外基金