Supply Current Testable Design of DACs in SoCs

针对片上系统(SoCS)中实现的数模转换器(DAC)，提出了一种测量电源电流的测试方法及其可测性设计方法。并对测试方法的可测性和可测性设计方法的面积开销进行了评估。结果表明，与功能测试法相比，本文提出的电源电流测试法可以用更少的测试向量来测试SoC中的DAC，并且面积开销也不是很大。

We developed a test method and its testable design methods for digital to analog convertors(DACs) implemented in SoCs(System-on-Chips) by measuring supply current. Also, we evaluated the testability of the test method and area overhead of the testable design methods. The results show us that a DAC in an SoC can be tested with a smaller number of test vectors by our supply current test method than a functional test one and the area overhead is not so large.