Supply Current Testable Design of DACs in SoCs

提出了一种基于电源电流测量的片上系统（SoC）数模转换器（DAC）测试方法及其可测性设计方法。此外，我们评估了测试方法的可测试性和可测试设计方法的面积开销。实验结果表明，与功能测试方法相比，本文提出的电源电流测试方法可以用较少的测试向量对SoC中的DAC进行测试，且面积开销较小。

We developed a test method and its testable design methods for digital to analog convertors(DACs) implemented in SoCs(System-on-Chips) by measuring supply current. Also, we evaluated the testability of the test method and area overhead of the testable design methods. The results show us that a DAC in an SoC can be tested with a smaller number of test vectors by our supply current test method than a functional test one and the area overhead is not so large.