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Proposal of varialbe-area electrode structure by field effect and its application to variable capacitors

Proposal of varialbe-area electrode structure by field effect and its application to variable capacitors
场效应变面积电极结构的提出及其在可变电容器中的应用
批准号:
24360119
负责人:
TOKUMITSU Eisuke
金额:
$11.65万
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
2012
资助国家:
日本
项目状态:
已结题
起止时间:
2012-04-01 至 2015-03-31

项目摘要

项目成果

TOKUMITSU Eisuke的其他基金

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会议论文
DOI: --
发表时间: 2014
期刊:
影响因子: --
作者: [Ken-Ichi Haga, Yuki Nakada, Dan Ricinschi and Eisuke Tokumitsu]
通讯作者: Dan Ricinschi and Eisuke Tokumitsu
Investigation of solution-processed bismuth-niobium-oxide films
溶液处理氧化铋铌薄膜的研究
DOI: 10.1063/1.4898323
发表时间: 2014
期刊: J. Appl. Phys.
影响因子: --
作者: [Satoshi Inoue, Tomoki Ariga, Shin Matsumoto, Masatoshi Onoue, Takaaki Miyasako, Eisuke Tokumitsu, Norimichi Chinone, Yasuo Cho and Tatsuya Shimoda]
通讯作者: Yasuo Cho and Tatsuya Shimoda
Relationship between Source/Drain-Contact Structures and Switching Characteristics in Oxide-Channel Ferroelectric-Gate Thin-Film Transistors
氧化物沟道铁电栅薄膜晶体管的源极/漏极接触结构与开关特性之间的关系
DOI: 10.7567/jjap.53.09pa07
发表时间: 2014
期刊: Jpn. J. Appl. Phys
影响因子: --
作者: [Ken-ichi Haga, Yuuki Nakada, Dan Ricinschi, and Eisuke Tokumitsu]
通讯作者: and Eisuke Tokumitsu
Evaluation of Channel Modulation in IN203/(Bi, La)4Ti3012 Ferrolectric-Gate Thin Film Transistors by Capacitance-Voltage Measurements
通过电容电压测量评估 IN203/(Bi, La)4Ti3012 铁电栅极薄膜晶体管的通道调制
DOI: 10.1080/00150193.2012.676933
发表时间: 2012
期刊: Ferroelectrics
影响因子: 0.8
作者: [0. Kojima, S. Ohta, T. Kita, and T.Isu, Eisuke Tokumitsu & Kazuya Kikuchi]
通讯作者: Eisuke Tokumitsu & Kazuya Kikuchi
22
    Current control of graphene channel transistors using semiconductor contacts
    Study on lithography-less solution process for nano-devices and its application to nonvolatile memories
    Proposal of huge-charge-controlled field-effect transistor using ferroelectric gate insulator and its application to next-generation integrated circuits
    Systematic survey and property control of high-dielectric-constant thin films for gate insulators of next generation MOSFETs