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Palladium electroplated tungsten semiconductor probes to minimise Palladium use in semiconductor test

Palladium electroplated tungsten semiconductor probes to minimise Palladium use in semiconductor test
电镀钯钨半导体探针可最大程度地减少半导体测试中钯的使用
批准号:
10064110
负责人:
金额:
$6.61万
依托单位:
依托单位国家:
英国
项目类别:
Collaborative R&D
财政年份:
2023
资助国家:
英国
项目状态:
已结题
起止时间:
2023 至 --

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英文摘要
TauProbes is the only UK manufacturer of semiconductor test probes for the global semiconductor test market. We offer test probes based on a tungsten probe body. The Innovate UK funded project will enable TauProbes to develop a Palladium plating process for the tips of our probes to enhance performance. This will enable TauProbes to produce the worlds most performant semiconductor test probes but with just a fraction of the expensive Palladium used in the leading high-performance probes on the market today. The probe technology has been designed from the start to allow damaged probes within a probe card to be repaired; this project will extend this further to enable the re-platting of worn probes. The removal of most of the Palladium in the probe will remove the need to import this material from Russia for the semiconductor test market. TauProbes is a key player in the on-going on-shoring of the semiconductor chip manufacture and test supply chain with its UK designed and manufactured state-of-the-art semiconductor test probe.
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