Imaging defects at atomic resolution via state-of-the-art atomic force microscopy and petascale simulations

通过最先进的原子力显微镜和千万亿次模拟以原子分辨率对缺陷进行成像

• 批准号: DP140101776
• 负责人: Prof Andrew Rohl
• 金额: $ 22.86万
• 依托单位: Curtin University
• 依托单位国家: 澳大利亚
• 项目类别: Discovery Projects
• 财政年份: 2014
• 资助国家: 澳大利亚
• 起止时间: 2014-06-30 至 2017-12-31
• 项目状态: 已结题
• 来源: https://dataportal.arc.gov.au/RGS/Web/Grants/DP140101776
• 关键词: Imaging; defects; atomic; resolution; via

Atomic force microscopy (AFM) promises to deliver resolution of individual atoms on surfaces and therefore, in principle, is capable of observing surface defects. However, the image obtained is a convolution of many complex interactions. Thus the key questions are what is being actually observed when we see something with “atomic resolution” in AFM and can point defects be really detected? The aim of this proposal is to combine state-of-the-art experimental AFM techniques with computer simulations that are capable of generating AFM images to answer these questions. Our ability to harness the potential of AFM for many applications in areas such as nanoscience and crystal engineering hinges on being able to correctly interpret AFM images.

原子力显微镜 (AFM) 有望提供表面上单个原子的分辨率，因此原则上能够观察表面缺陷。然而，获得的图像是许多复杂相互作用的卷积。因此，关键问题是，当我们在 AFM 中看到具有“原子分辨率”的东西时，实际观察到的是什么，以及点缺陷是否真的可以被检测到？该提案的目的是将最先进的实验 AFM 技术与能够生成 AFM 图像来回答这些问题的计算机模拟相结合。我们能否利用 AFM 在纳米科学和晶体工程等领域的许多应用的潜力取决于能否正确解释 AFM 图像。