ToF-SIMS Instrument

ToF-SIMS仪器

• 批准号: 7040267
• 负责人: DAVID G CASTNER
• 金额: $ 49.98万
• 依托单位: UNIVERSITY OF WASHINGTON
• 依托单位国家: 美国
• 财政年份: 2006
• 资助国家: 美国
• 起止时间: 2006-03-15 至 2007-03-14
• 项目状态: 已结题
• 来源: https://reporter.nih.gov/project-details/7040267
• 关键词: DNA; bioengineering /biomedical engineering; biomaterial development /preparation; biomaterials; cell sorting; computers; implant; ions; library; mass spectrometry; microscopy; orientation; performance; tissue /cell culture; tissues; university

DESCRIPTION (provided by applicant): For biomedical systems, determining the chemical state (composition, molecular structure, and orientation) and distribution of biological moieties present on a surface is critical. Many important cells and tissue functions depend on the arrangement of molecules at their surfaces. Also, a central goal of modern bioengineering is the development of biomaterial surfaces that direct the biological healing response. These complex, novel surfaces are envisioned to have a well-defined array of recognition sites designed to interact specifically with cells. Thus, it is essential to develop surface analysis techniques capable of providing detailed surface chemical state information at high spatial resolutions. The IONTOF time-of-flight secondary ion mass spectrometry (ToF-SIMS) system requested in this application will provide essential, new capabilities for these studies. In the past 10 years instrumentation manufacturers have made significant advances in all areas of ToF-SIMS instrument performance that will benefit NIH-funded biomedical research. The specific improvements over our current ToF-SIMS systems that will be provided by the new IONTOF TOF.SIMS5 system with Bi and Ceo cluster ion beam sources are: 1) >10x increase in secondary ion yield for most samples; 2) >30% improvement in mass resolution; 3) molecular depth profiling for some organic and biological samples (not currently possible with the existing instruments); 4) increased sensitivity providing lower detection limits and shorter data acquisition times; 5) more efficient and easier to use charge neutralization system; 6) computer controlled sample stage; 7) latest software (data acquisition, data analysis, and spectral library with search engine) and 8) decreased instrument downtime. In the imaging mode ToF-SIMS provides detailed information about the molecular surface structure at a spatial resolutions of < 2 microns (high mass resolution mode) and <200 nm (low mass resolution mode). This information is essential for determining the structure-function relationship of a biomaterial surface to its biological activity. Relevant applications for ToF-SIMS analysis include biocompatibility of implants, biomolecule separations, cell culture, biosensors, bacterial-induced corrosion, ELISA assays, and DNA manipulations. Combining the new capabilities of the proposed ToF-SIMS system with the existing the University of Washington imaging electron spectroscopy for chemical analysis (ESCA) and scanning probe microscopy (SPM) systems will provide a powerful set of complementary biomedical surface analysis techniques that will make a significant contribution to NIH- funded biomedical research projects. Knowledge of the nature of biomedical implant surfaces and an understanding of how these surfaces direct biological processes is needed to permit the rational design of biomedical implants. The proposed ToF-SIMS instrument will help achieve this goal.

描述（由申请人提供）：对于生物医学系统，确定表面上存在的生物部分的化学状态（组成、分子结构和取向）和分布至关重要。许多重要的细胞和组织功能依赖于其表面分子的排列。此外，现代生物工程的中心目标是开发指导生物愈合反应的生物材料表面。这些复杂的、新颖的表面被设想为具有被设计为与细胞特异性相互作用的明确定义的识别位点阵列。因此，它是必不可少的，以发展表面分析技术，能够提供详细的表面化学状态信息，在高空间分辨率。本申请中要求的IONTOF飞行时间二次离子质谱（ToF-SIMS）系统将为这些研究提供必要的新功能。在过去的10年里，仪器制造商在ToF-SIMS仪器性能的所有领域都取得了重大进展，这将有利于NIH资助的生物医学研究。与我们目前的ToF-SIMS系统相比，具有Bi和Ceo团簇离子束源的新IONTOF TOF.SIMS5系统将提供的具体改进是：1）对于大多数样品，二次离子产率增加> 10倍; 2）质量分辨率提高>30%; 3）对于一些有机和生物样品，分子深度分析（目前用现有仪器不可能）; 4）增加的灵敏度，提供较低的检测限和较短的数据采集时间; 5）更有效和更容易使用的电荷中和系统; 6）计算机控制的样品台; 7）最新软件（数据采集、数据分析和带有搜索引擎的光谱库）和8）减少仪器停机时间。在成像模式下，ToF-SIMS以< 2微米（高质量分辨率模式）和<200 nm（低质量分辨率模式）的空间分辨率提供有关分子表面结构的详细信息。这些信息对于确定生物材料表面与其生物活性的结构-功能关系至关重要。ToF-SIMS分析的相关应用包括植入物的生物相容性、生物分子分离、细胞培养、生物传感器、细菌诱导的腐蚀、ELISA测定和DNA操作。将拟议的ToF-SIMS系统的新功能与现有的华盛顿大学成像电子能谱化学分析（ESCA）和扫描探针显微镜（SPM）系统相结合，将提供一套强大的互补生物医学表面分析技术，这将为NIH资助的生物医学研究项目做出重大贡献。生物医学植入物表面的性质的知识和这些表面如何直接生物过程的理解是需要允许合理设计的生物医学植入物。拟议的ToF-SIMS工具将有助于实现这一目标。