Cluster Ion Sources for ToF-SIMS

用于 ToF-SIMS 的簇离子源

• 批准号: 8246268
• 负责人: DAVID G CASTNER
• 金额: $ 37.46万
• 依托单位: UNIVERSITY OF WASHINGTON
• 依托单位国家: 美国
• 财政年份: 2012
• 资助国家: 美国
• 起止时间: 2012-05-04 至 2013-05-03
• 项目状态: 已结题
• 来源: https://reporter.nih.gov/project-details/8246268
• 关键词: Antibodies; Biocompatible Materials; Biological; Biosensor; Carbohydrates; Cells; Chemicals; DNA; Devices; Funding; Grant; Ions; Manufacturer Name; Methods; Microbial Biofilms; Molecular; Molecular Structure; Pharmaceutical Preparations; Research Project Grants; Resolution; Sampling; Source; Specificity; Spectrometry, Mass, Secondary Ion; Stents; Surface; Techniques; Three-Dimensional Imaging; Time; Tissue Engineering; Tissues; United States National Institutes of Health; Universities; Washington; improved; instrument; ion source; medical implant; scaffold

DESCRIPTION (provided by applicant): Many important cell and tissue functions depend on the surface presentation of molecules, so it is critical to determine the chemical state (composition, molecular structure, and orientation) as well as the distribution of biological moieties present on a surface and in the near surface region of biomedical devices. Thus, it is essential to develop surface analysis techniques capable of providing quantitative and detailed surface chemical state information at high spatial resolutions, both for 2-D and 3-D imaging of biological materials. Time-of-flight secondary ion mass spectrometry (ToF-SIMS), with its high chemical specificity and spatial resolution, is an excellent method for obtaining this information. However, until commercial cluster ion beam sources became readily available in the last 5-10 years, ToF-SIMS analysis was limited to analyzing the outer ~2nm of biological materials. This is because the commercial high-energy, monoatomic ion sources available on the initial ToF-SIMS instruments (Ga+, Cs+, etc.) resulted in significant sample degradation and loss of molecular information during sputtering. Several years ago commercial cluster ion sources such C60+ became available. These sources were capable of molecular depth profiling of biological materials and opened the possibility of 3-D imaging with ToF-SIMS. In late 2010 the manufacturer of our ToF-SIMS instrument at the University of Washington (IONTOF) introduced two new cluster ion beam sources for their TOF.SIMS 5 instrument (a new Ar cluster ion source and significantly upgraded C60 cluster ion source). The Ar cluster ion source offers significant advantages over previous cluster ion sources (significantly improved depth resolution and applicability to a wider range of materials). The new C60 cluster ion source offers significant improvements over our existing C60 source (2x increase in ion energy, as well as significant enhancements in both mass and spatial resolution). To capitalize on these new capabilities and the benefits they will provide to NIH- funded research projects, we are requesting $374,604.80 to upgrade our existing IONTOF TOF.SIMS 5 instrument with the new cluster ion beam sources. The National ESCA and Surface Analysis Center for Biomedical Problems (NESAC/BIO, NIH grant EB-002027) will provide an additional $50,000 for the purchase of these ion sources. Research projects that will benefit from the new capabilities of the Ar and C60 cluster ion beam sources include analysis of medical implants (e.g., drug-loaded/coated stents), biofilms, cell sheets, tissue sections, tissue engineering scaffolds, microarray devices (DNA, antibody, carbohydrate, etc.), biosensors, etc. PUBLIC HEALTH RELEVANCE: Knowledge about biomedical implant surfaces and an understanding of how these surfaces interact and direct biological processes when such a device is placed in the body is needed to permit the rational design of new and improved biomedical implants. The proposed cluster ion beam sources will provide new information about the surface properties of biomedical devices, as well as the biomolecules and cells interacting with those devises, that is needed to achieve this objective.

描述(申请人提供)：许多重要的细胞和组织功能依赖于分子的表面呈现，因此确定生物医学设备表面和近表面区域中存在的生物部分的化学状态(组成、分子结构和取向)以及分布是至关重要的。因此，开发能够以高空间分辨率提供定量和详细的表面化学状态信息的表面分析技术对于生物材料的2-D和3-D成像都是至关重要的。飞行时间二次离子质谱仪(ToF-SIMS)具有很高的化学专属性和空间分辨率，是获取这一信息的一种很好的方法。 然而，直到最近5-10年商业团簇离子束源出现之前，ToF-SIMS分析仅限于分析生物材料的外~2 nm。这是因为最初的ToF-SIMS仪器上提供的商用高能单原子离子源(Ga+，Cs+等)。导致样品在溅射过程中显著降解和分子信息丢失。几年前，C60+等商业团簇离子源问世。这些来源能够对生物材料进行分子深度剖析，并为使用ToF-SIMS进行三维成像打开了可能性。2010年底，我们的TOF-SIMS仪器制造商在华盛顿大学(IONTOF)为他们的TOF.SIMS 5仪器引入了两个新的团簇离子束源(一个新的Ar团簇离子源和显著升级的C60团簇离子源)。与以前的团簇离子源相比，Ar团簇离子源具有显著的优势(显著提高了深度分辨率和对更广泛材料的适用性)。新的C60团簇离子源比我们现有的C60源提供了显著的改进(离子能量增加了2倍，质量和空间分辨率都有了显著的增强)。为了充分利用这些新能力以及它们将为美国国立卫生研究院资助的研究项目带来的好处，我们申请了374,604.80美元，用于用新的团簇离子束源升级我们现有的IONTOF TOF.SIMS 5仪器。国家ESCA和生物医学问题表面分析中心(NESAC/BIO，NIH赠款EB-002027)将额外提供50,000美元用于购买这些离子源。将受益于Ar和C60团簇离子束源的新能力的研究项目包括医疗植入物(例如，载药/涂层支架)、生物膜、细胞片、组织切片、组织工程支架、微阵列设备(DNA、抗体、碳水化合物等)、生物传感器等的分析。 公共卫生相关性：需要了解生物医学植入物表面的知识，并了解这些表面如何相互作用，以及当这样的装置被放置在体内时如何指导生物过程，以允许合理设计新的和改进的生物医学植入物。所提出的团簇离子束源将提供关于生物医学设备表面属性的新信息， 以及与这些设备相互作用的生物分子和细胞，这是实现这一目标所必需的。

项目成果

Biomedical surface analysis: Evolution and future directions (Review).

• DOI: 10.1116/1.4982169
• 发表时间: 2017-04-24
• 期刊: Biointerphases
• 影响因子: 2.1
• 作者: Castner DG

Photo-induced halide redistribution in organic-inorganic perovskite films.

• DOI: 10.1038/ncomms11683
• 发表时间: 2016-05-24
• 期刊: Nature communications
• 影响因子: 16.6
• 作者: deQuilettes DW;Zhang W;Burlakov VM;Graham DJ;Leijtens T;Osherov A;Bulović V;Snaith HJ;Ginger DS;Stranks SD
• 通讯作者: Stranks SD