An advanced X-ray facility for surface and in-situ materials characterization

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An advanced X-ray facility for surface and in-situ materials characterisation: Materials properties are crucial to the performance of devices and structures, and detailed characterisation at a molecular level is important for optimizing new materials. X-rays are a powerful means of achieving the required level of detail in structural characterisation. The aim of this project is to make available an extremely bright X-ray source with a suite of advanced analytical tools, including surface structural analysis by reflectometry and grazing incidence diffraction and materials structure determination using powder diffraction and microdiffraction at high and low temperatures. The functions of this facility are broad and its applications include materials science, organic electronics, biomaterials and engineering.