Optical frequency domain reflectometry on a chip

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This project will investigate integrated photonic devices, circuits, and proof-of-concept prototypes for on-chip optical frequency domain reflectometry (OFDR) systems. OFDR is an interferometry technique that extracts the positions and optical scattering strengths of scatterers along the propagation path of a light beam from the backscattered light. OFDR is a highly versatile measurement technique. For example, it enables the rapid measurement of the optical propagation losses in waveguides in a single shot, the determination of faults and defects that are far away from the light source, and distributed measurements of temperature and mechanical stress. At present, commercially available instruments for OFDR are bulky, constructed from bulk and fiber optics, and expensive. This project will overcome the limitations of cost and size of OFDR using state-of-the-art photonic integrated circuit technology. We will demonstrate chip-scale versions of the reflectometer using a customized photonic platform on silicon, the workhorse material of electronics. The partner company, a world leader in optical test and measurement equipment, will provide invaluable expertise in specifying the requirements of OFDR and translating the results into practice, while the University of Toronto team will develop the physical technologies. Not only can the research results increase the productivity in the partner company and lead to potentially new products, they will also have significant impact to the fields of photonic integration and optical communications, where OFDR can reduce design and manufacturing costs. Ultimately, enhanced test and measurement capabilities often open areas of research and discovery by enabling users to quantify the physical world in new ways.