Optical frequency domain reflectometry on a chip

芯片上的光频域反射计

• 批准号: 500311-2016
• 负责人: Poon, Joyce
• 金额: $ 5.54万
• 依托单位: University of Toronto
• 依托单位国家: 加拿大
• 项目类别: Collaborative Research and Development Grants
• 财政年份: 2017
• 资助国家: 加拿大
• 起止时间: 2017-01-01 至 2018-12-31
• 项目状态: 已结题
• 来源: https://www.nserc-crsng.gc.ca/ase-oro/Details-Detailles_eng.asp?id=618653
• 关键词: Optical; frequency; domain; reflectometry; chip

This project will investigate integrated photonic devices, circuits, and proof-of-concept prototypes for on-chip optical frequency domain reflectometry (OFDR) systems. OFDR is an interferometry technique that extracts the positions and optical scattering strengths of scatterers along the propagation path of a light beam from the backscattered light. OFDR is a highly versatile measurement technique. For example, it enables the rapid measurement of the optical propagation losses in waveguides in a single shot, the determination of faults and defects that are far away from the light source, and distributed measurements of temperature and mechanical stress. At present, commercially available instruments for OFDR are bulky, constructed from bulk and fiber optics, and expensive. This project will overcome the limitations of cost and size of OFDR using state-of-the-art photonic integrated circuit technology. We will demonstrate chip-scale versions of the reflectometer using a customized photonic platform on silicon, the workhorse material of electronics. The partner company, a world leader in optical test and measurement equipment, will provide invaluable expertise in specifying the requirements of OFDR and translating the results into practice, while the University of Toronto team will develop the physical technologies. Not only can the research results increase the productivity in the partner company and lead to potentially new products, they will also have significant impact to the fields of photonic integration and optical communications, where OFDR can reduce design and manufacturing costs. Ultimately, enhanced test and measurement capabilities often open areas of research and discovery by enabling users to quantify the physical world in new ways.

该项目将研究集成光子器件、电路和用于片上光频域反射（OFDR）系统的概念验证原型。OFDR是一种干涉测量技术，其从后向散射光提取沿着光束的传播路径的散射体的位置和光学散射强度。OFDR是一种高度通用的测量技术。例如，它可以在单次拍摄中快速测量波导中的光传播损耗，确定远离光源的故障和缺陷，以及分布式测量温度和机械应力。目前，用于OFDR的市售仪器体积庞大，由散装和光纤构成，并且昂贵。该项目将克服OFDR的成本和尺寸的限制，使用最先进的光子集成电路技术。我们将展示芯片级版本的反射计，使用硅上的定制光子平台，电子产品的主力材料。该合作伙伴公司是光学测试和测量设备的世界领先者，将在指定OFDR要求和将结果转化为实践方面提供宝贵的专业知识，而多伦多大学的团队将开发物理技术。这些研究成果不仅可以提高合作公司的生产力并产生潜在的新产品，还将对光子集成和光通信领域产生重大影响，OFDR可以降低设计和制造成本。最终，增强的测试和测量功能通常通过使用户能够以新的方式量化物理世界来打开研究和发现的领域。