Photoemission yield spectrometer for surfaces and semiconductors

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We seek funding to acquire an atmospheric pressure photoelectron yield spectrometer (PEYS) to characterize surfaces, semiconducting films and other advanced materials. PEYS allows “soft” non-destructive measurements of workfunction of metals, conductance band of semiconductors and HOMO of molecular/polymer films and powders. This is becoming a “must have” technology in organic electronics, and would likewise have a transformational effect in many related fields (quantum dots, self-assembled monolayers, etc). However, no such instruments are available in Canada. The current alternative is a combination of electrochemical and ultra-violet photoelectron spectroscopy (UPS) measurements which are significantly more complicated. Furthermore, there is a significant ambiguity in the energy levels they provide, and these are strongly affected by the environment (electrolyte or ultra-high vacuum). The instrument will become a central departmental materials characterization facility, which is used extensively by several dozens research groups at McGill and other Quebec universities (via Quebec Center for Advanced Materials -CQMF). We estimate that at least 10-20 students will receive hands-on training in the use of PEYS each year, and the CQMF research associate (P. Fiurasek) will perform sample measurements for many other academic groups throughout Canada.