Scanning Probe Microscopy for Materials Research

扫描探头在三个一般领域的研究 显微镜用于材料研究：（i）基础 研究探针与表面的相互作用， 成像中的对比机制，（ii） 材料研究，特别强调成像电流 传输路径，和（iii）温和的原子力的发展 软材料显微镜、液氮的研制 温度显微镜和原子力的发展 带有导电尖端的显微镜，用于同时成像 表面形貌和表面导电性。

Investigations in three general areas in which scanning probe microscopy is employed for materials research: (i) fundamental studies of probe-surface interactions to enhance understanding of contrast mechanisms in imaging, (ii) trial applications in materials research, with special emphasis on imaging current transport paths, and (iii) development of gentler atomic force microscopes for soft materials, development of liquid nitrogen temperature microscopes, and development of atomic force microscopes with conducting tips for simultaneous imaging of surface topography and surface conductivity.