WORKSHOPS: Institute for Mathematics and Its Applications "Initiative in Materials Science"; January 24-26, 1996 and February 1-3, 1996; Minneapolis, Minnesota

小行星9626139 该奖项将为两个为期三天的研讨会提供部分支持， 在大学数学及其应用研究所举行 1996年1月底和2月初，明尼苏达州。 的 研讨会将集中在以下主题：（1）微观结构和薄 薄膜和（2）薄膜的“智能”传感和控制。 第一 研讨会将集中在薄膜。 计算方法 薄膜的建模通常集中在原子尺度上， 在连续体尺度上。 然而，由于时间的不同， 以及这些不同模型中涉及的长度尺度，它们目前还不是 有联系 这限制了任一模型描述过程的能力 适合工业材料制造。 增加的计算 电力不能解决这个问题，因为扩大规模或 从这些模型中按比例缩小还不存在。 虽然计算 功率可能允许规模扩大，更复杂的技术必须 为解决时间尺度问题而开发。 研讨会将带来 材料科学和材料科学领域的数学家们 科学家们使用建模和模拟，以共同解决 微观-宏观联系需要了解微观结构演变薄 薄膜. 一系列会谈和讨论预计将导致一系列 关于如何使用多尺度技术开发模型的建议。 的 实现这些建议的最终目标是：（1）高保真 薄膜过程的模拟，将从头算、计算 连续体微观结构/性能模型，以及（2）提取方法 从这些完整的模拟，是合适的物理非经验模型 用于实时过程控制。 第二次研讨会也将重点放在薄 电影，但从不同的角度来看。 控制器在宏操作 水平 在这个层次上，模型是在连续体尺度上， 演化由偏微分方程（PDE）决定。 溶液 PDE技术需要目前最强大的计算机 available. 这种细节级别的模型不适合实时处理 控制 研讨会将探讨数学的研究思路 从完整模型中提取主导参数的方法。 理解微观与宏观的联系对于成功地 使用反馈控制。 第二次研讨会特别关注的一个议题 是“智能”传感器，即“理解”过程模型的传感器， 能够直接或间接地使用 这些模型。 它将强调允许传感器推断的算法 对于不能从其他参数中提取感兴趣的参数的情况， 直接感测物理化学模型指示的参数， 这对过程的控制至关重要。

9626139 Friedman This award will provide partial support for two three-day workshops to be held at the Institute for Mathematics and Its Applications of the University of Minnesota in late January and early February, 1996, respectively. The workshops will focus on the following topics: (1) Microstructure and Thin Films and (2) "Smart" Sensing and Control of Thin Films. The first workshop will concentrate on thin films. Computational approaches to modeling thin films have generally focused either on the atomistic scale or on the continuum scale. However, because of the drastically different time and length scales involved in these disparate models, they are not currently linked. This limits the ability of either model to describe the process adequately for industrial materials manufacturing. Increased computational power will not solve this problem because strategies for scaling up or scaling down from these models do not yet exist. Although computational power might allow scaling up in size, more sophisticated techniques must be developed for dealing with time scale issues. The workshop will bring together mathematicians working in materials science and materials scientists who use modeling and simulation in order to jointly address the micro-macro linkage needed to understand microstructure evolution in thin films. A series of talks and discussions are expected to lead to a set of suggestions on how to develop models using multiscaling techniques. The eventual goals in realizing these suggestions are: (1) high-fidelity simulations of thin-film processes which link ab initio, calculations to continuum microstructure/property models, and (2) approaches to extracting physical non-empirical models from these full simulations that are suitable for real-time process control. The second workshop will also focus on thin films, but from a different perspective. Controllers operate at the macro level. At this level the models are at the continuum scale and their evolution is dictated by partial differential equations (PDE). Solution techniques for PDE require the most powerful computers currently available. Models at this level of detail are unsuitable for real-time process control. The workshop will explore research ideas on mathematical approaches for extracting the dominant parameters from the full model. Understanding the micro-macro linkage will be essential for success in using feedback control. A topic of special interest of the second workshop is "smart" sensors, that is, sensors that "understand" the process models and are able to determine process parameters either directly or indirectly using these models. It will emphasize algorithms which allow sensors to infer parameters of interest from other parameters for cases where one cannot directly sense a parameter that the physicochemical models indicates is critical to the control of the process.