Development of a New Scanning Tunneling Probe Microscope with Ultrahigh Charge/Current Detection Sensitivity for Electronic Characterization of Atomic Scale Structures

该项目的目的是开发一种基于扫描隧道显微镜（STM）和改进的静电力显微镜（EFM）集成的新仪器。这种被称为扫描隧道电荷转移显微镜（STCTM）的新仪器将在超高真空室中工作，并将提供一种以原子空间分辨率在原子尺度表面结构之间转移单个电子的方法。它将提供测量表面对转移电荷的电子响应的能力。所提出的扫描探针尖端也可以测量到超小电流。所提出的工作将大大扩展现有的原子尺度表征方法的能力。超小电荷/电流检测与原子空间分辨率的结合为研究导电和绝缘纳米结构提供了强有力的工具。这些测量能力将对材料研究产生深远的影响，特别是在纳米结构材料和器件领域。＊＊＊

9626286 Williams The objective of this project is to develop a new instrument based upon the integration of Scanning Tunneling Microscope (STM) and a modified Electrostatic Force Microscope (EFM). The new instrument called the Scanning Tunneling Charge Transfer Microscope (STCTM) will operate in an ultra-high vacuum chamber, and will provide a means to transfer single electrons to and from atomic scale surface structure with atomic spatial resolution. It will provide the ability to measure the electronic response of the surface to the transferred charge. Ultrasmall currents should also be measurable by the proposed scanning probe tips. The proposed work will significantly extend the capabilities of existing atomic scale characterization methods. The combination of ultrasmall charge/current detection and atomic spatial resolution provides a powerful tool for examining conducting and insulating nanostructure. These measurement capabilities should have a profound impact on materials research, especially in the area of nanostructured materials and devices. ***