Acquisition of an Atomic Force Microscope for Analysis of Inorganic, Organic and Biological Surface Structures

化学研究仪器和设施计划(CRIF)的这一奖项将帮助宾夕法尼亚州立大学化学系获得原子力显微镜(AFM)。该设备将加强以下领域的研究：(1)无机单分子膜的结构、动力学和物理性质；(2)用于生物界面和纳米电子器件的自组装单分子膜；(3)电子束诱导自组装单分子膜的化学及其在光刻中的应用；(4)通过金表面催化分解重氮甲烷对聚亚甲基团簇的成核和生长研究；(5)超薄聚酰亚胺薄膜的表面取向效应；(6)基于自组装贵金属胶体单分子膜的复合层结构；(7)T4复制系统作为DNA复制的模型；(8)连续和不连续Au表面的纳米结构；(9)可调微波频率交流扫描隧道显微镜(ACSTM)和AFM图像的比较。原子力探测显微镜(AFM)使研究人员能够直接对原子成像。这项技术利用了压电效应，将一根非常锋利的金属针带入样品表面几埃的范围内。距离足够小，电子可以泄漏或通过隧道穿过缝隙，产生微小的电流。随着针尖和样品之间的间隙增加，电流减小。当探测器穿过样品，在样品表面来回移动时，它会绘制出样品表面原子的等高线图。原子力显微镜用于控制用于制造半导体电路的材料。

This award from the Chemistry Research Instrumentation and Facilities Program (CRIF) will assist the Department of Chemistry at Pennsylvania State University acquire an atomic force microscope (AFM). This equipment will enhance research in a number of areas including the following: (1) structure, dynamics, and physical properties of inorganic monolayers; (2) self- assembly of monolayers for application in bio-interfaces and nano-electronic devices; (3) electron-beam-induced chemistry in self-assembled monolayers with applications to lithography; (4) nucleation and growth studies of poly(methylene) clusters via Au-surface catalyzed decomposition of diazomethane; (5) surface orientation effects in ultrathin polyimide films; (6) composite layer structures based on self-assembled noble-metal colloid monolayers; (7) T4 replication system as a model for DNA replication; (8) nanometer-scale structure in both continuous and discontinuous Au surfaces and (9) comparisons of the tunable microwave frequency AC scanning tunneling microscope (ACSTM) and AFM images. The atomic force probe microscope (AFM) enables researchers to image atoms directly. The technique uses the piezoelectric effect which involves bringing an extremely sharp metal needle within a few angstroms of the sample surface. The distance is small enough for electrons to leak or tunnel across the gap and generate a minute current. As the gap between the tip and the sample increases, the current decreases. As then probe crosses the sample, moving back and forth across its surface, it traces out a contour map of the sample's surface atoms. The AFM is used in the control of material used to fabricate semiconductor circuits.