Molecular Characterization at the Attomol Level

这项研究项目在德克萨斯农工大学的埃米尔·施韦克特教授的指导下，致力于痕量有机物的表面分析。分析和表面化学计划支持使用大量入射探测离子进行二次离子质谱分析的研究，以提高二次离子的产率，从而提高方法的灵敏度。Schweikert教授开发的符合检测方法被用来将这些测量中的检测极限提高到阿托摩尔水平。目前还在努力开发方法，以改进对这些团簇离子表面碰撞中形成的二次中性物质的探测。这项工作的结果为电子工业中的材料分析和了解重要的环境问题提供了改进的工具。本研究项目的目标是改进现有的在固体表面定性和定量检测有机物质的方法。这些方法将对改进电子材料加工以及对环境和生物具有重要意义的样品进行分析至关重要。使用巨弹入射离子的二次离子质谱仪，加上符合检测方案，有望显著提高这些分析方法的灵敏度。

This research project, under the direction of Professor Emile Schweikert of Texas A&M University, addresses the surface analysis of trace organics. The Analytical and Surface Chemistry Program supports these studies of secondary ion mass spectrometry using massive incident probe ions to enhance the yield of secondary ions, and thus increase the sensitivity of the method. Coincidence detection methods developed by Professor Schweikert are used to push the limits of detection in these measurements to the attomole level. Work is also underway to develop methods to improve the detection of secondary neutrals formed in these cluster ion surface collisions. The results of this work provide improved tools for the analysis of materials in the electronics industry and in the understanding of important environmental problems. The goal of this research project is to improve the methods available for qualitatively and quantitatively detecting organic materials at solid surfaces. These methods will be crucial to the improvement of electronic materials processing and to the analysis of environmentally and biologically important samples. Secondary ion mass spectrometry using mega-projectile incident ions, coupled with coincidence detection schemes promise a significant increase in sensitivity for these analysis methods.