Nanotechnology Research at Towson University

摘要CTS-9977530D。Towson State University的Schaefer将购买在Towson State University开发纳米技术设施所需的设备。该设施的目标包括(1)提供必要的设备、空间和专业知识，以协助汤森大学的研究人员进行前沿研究；(2)提供必要的设施，促进与其他大学和工业研究人员的合作；以及(3)提供一个设施，教育学生(本科生和研究生)和教职员工使用纳米技术。这样一个实验室的几个关键部件已经组装完毕，包括空间、人员和专门用于汤森大学本科生和研究生课程的扫描探针显微镜。目前还没有实现前两个目标所必需的研究质量的扫描探针显微镜。纳米技术实验室所需的主要仪器是数字仪器多模TM原子力显微镜(AFM)。在原子力显微镜中，柔性悬臂被用来探测材料的表面。通过监测悬臂梁在表面上移动时的挠度，原子力显微镜能够以亚纳米分辨率实时成像导电和绝缘材料的三维、真实空间的表面形貌。此外，它还能够在各种环境中工作，包括空气、真空和液体介质下。原子力显微镜还展示了定量测量两种材料之间的相互作用力的能力。

AbstractCTS-9977530D. Schaefer, Towson State UniversityThe necessary equipment to develop a Nanotechnology facility at Towson State University will be purchased. The goals of this facility include (1) to provide the necessary equipment, space and expertise to assist researchers at Towson University in performing cutting edge research, (2) to provide the facilities necessary to promote collaborations with other university and industrial researchers, and (3) to provide a facility which educates students (both undergraduate and graduate), and faculty in the use of nanotechnology. Several key components have been assembled for such a laboratory, including space, personnel, and a scanning probe microscope dedicated for undergraduate and graduate classes at Towson. There does not exist a research quality scanning probe microscope that is necessary for the achievement of the first two goals.The major piece of instrumentation needed for the Nanotechnology Laboratory is a Digital Instruments Multimode TM Atomic Force Microscope (AFM). In the AFM, a flexible cantilever is used to probe the surface of materials. By monitoring the deflection of the cantilever as it is moves across the surface, the Atomic Force Microscope is capable of imaging the surface topography of conducting and insulating materials in three dimensions, in real space, and in real time with sub-nanometer resolution. Additionally, it has the capability of operating in a variety of environments, including air, vacuum, and under liquid media. The AFM has also demonstrated the ability to quantitatively measure the interaction force between two materials