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Collaborative Research: Atomic Plane Electrical Contacts

Collaborative Research: Atomic Plane Electrical Contacts
合作研究:原子平面电接触
批准号:
0521985
负责人:
Alexander Slocum
金额:
$0.0万
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
2005
资助国家:
美国
项目状态:
已结题
起止时间:
2005-09-01 至 2008-08-31

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项目成果

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中文摘要
翻译
这项研究的目的是了解纳米级(十亿分之一米)结构如何影响电接触电阻和使用寿命。众所周知,粗糙的表面磨损很快,但是表面应该有多光滑才能使开关和继电器有更好的电接触?该方法是测试纳米级粗糙度的表面,在其上应用薄膜涂层,包括直接在接触测试中生长的碳纳米管,以及用于评估涂层表面样品的特殊仪器,以选择用于高循环测试的候选材料。这些合同将定期进行评估,以了解它们的长期表面行为。数学模型将被用来预测性能,并用于帮助设计更持久、更低电阻的微型电气开关。这项研究的社会影响包括教育和工业利益。现代社会离不开电子产品,电子设备也离不开可靠的高质量开关。随着电子产品的缩小,开关也必须缩小。在教育方面,一位最近在市中心教高中生的麻省理工学院博士毕业生,以及俄亥俄州立大学和麻省理工学院的学生将合作开发新的以纳米科学为中心的教材,用于核心的数学和科学课程。在工业上,这项研究将能够创造出更低电阻、更长寿命的电触点。这家工业合作伙伴将能够制造更小的电子探头,用于测试硅微芯片。
英文摘要
The objective of this research is to develop an understanding of how nanometer scale (one billionth of a meter) structures affect electrical contact resistance and useful life. It is known that rough surfaces wear quickly, but how smooth should surfaces be to make better electrical contacts for switches and relays? The approach is to test surfaces with nanometer-scale roughness to which are applied thin-film coatings, including carbon nanotubes grown directly on the contact testing along with a special apparatus for evaluating coated surfaces samples to choose candidate materials for high-cycle testing. The contracts will be evaluated at regular intervals to develop an understanding of their long-term surface behavior. Mathematical models will be made to predict performance and used to help design longer lasting lower resistance miniature electrical switches.The societal impact of this research includes educational and industrial benefits. Modern society cannot function without electronics, and electronic devices cannot function without reliable high quality switches. As electronics shrink, so must the switches. Educationally, a recent MIT Ph.D. graduate, who has been teaching inner-city high school students, and students, from OSU and MIT will work together to develop new nanoscience-centered teaching materials for use in core math an science classes. Industrially, this research will enable the creation of lower resistance longer life electrical contacts. The industrial partner will be able to make smaller electrical probes for testing silicon microchips.
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会议论文
NER: Silicon Insert Molded Plastics (SIMP)
Creating the Nanogate for Experimental Verification and Development of Flow and Particle Behavior in Sub-Micron Channels
SGER: NanoGate - A New Micromechanical Mechanism for Valves and Relays
Development of a High Speed, High Precision Machining Center(ARI/MME)
国内基金
海外基金
Research on Quantum Field Theory without a Lagrangian Description
  • 批准号:
    24ZR1403900
  • 项目类别:
    省市级项目
  • 资助金额:
    --
  • 批准年份:
    2024
  • 负责人:
    SATOSHI NAWATA
  • 依托单位:
Cell Research
Cell Research
Cell Research (细胞研究)