课题基金 / 基金详情

MRI: Aquisition of a Hall Effect Measurement System for Characterizing Novel Semiconductors

MRI: Aquisition of a Hall Effect Measurement System for Characterizing Novel Semiconductors
MRI:获取用于表征新型半导体的霍尔效应测量系统
批准号:
0619423
负责人:
James Edgar
金额:
$15.46万
依托单位:
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
2006
资助国家:
美国
项目状态:
已结题
起止时间:
2006-09-01 至 2008-08-31

项目摘要

项目成果

James Edgar的其他基金

相似基金

相关文献

中文摘要
翻译
堪萨斯州立大学将获得一个霍尔效应测量系统,用于表征新型半导体的电子输运特性。这是一个高度敏感的系统,能够测量宽电阻范围(0.05 mW至200 GW),最大电压为95 V,最小和最大电流分别为500 fA和100 mA。该系统包括一个最大场强为1.04 t的可变间隙电磁铁,计算机控制磁场和施加电压的变化,使其能够区分多层样品中各个层的电性能。许多具有广泛应用的半导体将被研究,包括B12As2 -辐射探测和直接核到电能转换装置的候选者,用于深紫外led和激光二极管的高掺杂氮化铝,用于固态辐射传感器的HgI2和CdZnTe,以及其他新兴的重要半导体。该系统的先进功能和易用性将有助于促进校园内不同学科的学生和教师之间以及大学之间的合作。霍尔效应测量将被纳入本科工程课程的演示和实验中,以加强学生对迁移率和载流子浓度的学习,通过这种广泛使用的技术来测量。效应测量是测定半导体电学特性(如电子速度和浓度)最常用的方法。这些特性必须知道设计和制造所有类型的电子设备,如发光二极管(led),激光二极管和传感器,以检测光(从紫外线到红外线)和核辐射。这类设备存在于交通信号灯、汽车、激光打印机、激光唱机、环境和安全监测器中,这只是举几个例子。新的霍尔效应测量系统将加强堪萨斯州立大学在传感器开发方面不断增长的跨学科项目。该系统提供的特性将导致更好的材料和新的,更高效和敏感的传感器。该系统还将有助于学生教育;使用该系统的新实验将被纳入工程本科学生的实验室,以帮助他们更好地了解材料的电学性质。该系统将在大学开放日和高中生暑期研修等教育推广活动中展示,以激发普通大众对科学的兴趣,并鼓励学生考虑从事技术职业。
英文摘要
Technical AbstractKansas State University will acquire a Hall effect measurement system for characterizing the electron transport properties of novel semiconductors. This is a highly sensitive system capable of measurements over a wide resistance range (0.05 mW to 200 GW), with a maximum voltage of 95 V, and minimum and maximum currents of 500 fA and 100 mA respectively. The system includes a variable gap electromagnet with a maximum field strength of 1.04 T. Computer controlled variations of the magnetic field and applied voltage makes it possible to distinguish the electrical properties of individual layers in multilayer samples. Many semiconductors with a wide range of applications will be studied including B12As2 -a candidate for radiation detection and direct nuclear to electrical energy conversion devices, heavily doped aluminum nitride for deep ultraviolet LEDs and laser diodes, HgI2 and CdZnTe for solid state radiation sensors, and other semiconductors of emerging importance. The state-of-the-art capabilities and ease of use of this system will help to promote collaborations between students and faculty in different disciplines on campus and between universities. Hall effect measurements will be incorporated into demonstrations and experiments in undergraduate engineering courses to enhance student learning of mobility and charge carrier concentrations, as measured by this widely employed technique. Lay AbstractHall effect measurements are the most common method to determine the electrical properties of a semiconductor, such as electron speed and concentration. These properties must be known to design and fabricate all types of electronic devices such as light emitting diodes (LEDs), laser diodes, and sensors to detect light (from ultraviolet to infrared) and nuclear radiation. Such devices are found in traffic lights, automobiles, laser printers, compact disc players, and environmental and safety monitors, just to cite a few examples. The new Hall effect measurement system will enhance a growing cross-disciplinary program at Kansas State University in sensor development. Characterization provided by this system will lead to better materials and new, more efficient and sensitive sensors. The system will also help with student education; new experiments using this system will be incorporated into the laboratories of undergraduate engineering students, to help them to better understand the electrical properties of materials. This system will be displayed at educational outreach activities such as the university open house and summer institutes for high school students, to spark interest in science by the general public and to encourage students to consider careers in technology.
期刊论文(0)
专著(0)
科研奖励(0)
会议论文
Intergovernmental Mobility Assignment
  • 批准号:
    1943430
  • 项目类别:
    Intergovernmental Personnel Award
  • 资助金额:
    $29.55万
  • 财政年份:
    2019
  • 负责人:
    James Edgar
  • 依托单位:
Hexagonal Boron Nitride Crystal Growth from Solution: A Study of Fundamentals
  • 批准号:
    1538127
  • 项目类别:
    Standard Grant
  • 资助金额:
    $29.73万
  • 财政年份:
    2015
  • 负责人:
    James Edgar
  • 依托单位:
I-Corps: Hexagonal Boron Nitride for Electronic Devices
  • 批准号:
    1339054
  • 项目类别:
    Standard Grant
  • 资助金额:
    $5.0万
  • 财政年份:
    2013
  • 负责人:
    James Edgar
  • 依托单位:
ARI-MA: Collaborative Research: Hexagonal Boron Nitride Based Neutron Detectors
  • 批准号:
    1038890
  • 项目类别:
    Standard Grant
  • 资助金额:
    $20.81万
  • 财政年份:
    2010
  • 负责人:
    James Edgar
  • 依托单位:
海外基金