120 kV Transmission Electron Microscope

120千伏的透射电子显微镜将取代技术上过时的透射电子显微镜。这台过时的TEM已不再提供服务。重要部件的故障会导致机器完全丧失功能。这将导致我们成像核心设施的服务组合出现严重缺口，我们无法提供全面的服务，就像我们目前在透射电镜方面所做的那样。此外，新的TEM应该提供stem断层扫描的可能性，这也将减轻我们的高端200kV TEM在电子断层扫描方面的使用压力。

The 120 kV Transmission Electron Microscope will replace a technical out-of-date TEM. For this outdated TEM no more service is available. A failure of important components can lead to a total loss of function of the machine. This would lead to a critical gap in our service portfolio of our imaging core facility and we could not provide the services in the full breadth, as we currently do in regard to Transmission Electron Microscopy. Moreover, the new TEM should provide the possibility of STEM-Tomography which additionally would relieve usage pressure from our high-end 200kV TEM in regard to electron tomography.