Improving silicon grain boundaries by linking electronic material quality and device manufacturing conditions

该项目发展了我们最近的发现，用于改善电子器件中的硅晶界，例如廉价太阳能电池、有源矩阵显示器、薄膜晶体管等。这些器件的性能及其应用受到限制，主要是因为没有发现制造条件和器件质量之间的简单联系。然而，我们最近在一系列器件上验证了晶界的物理模型描述，这使我们能够找到这种联系，并从一个新的角度解决普遍存在的问题。这将提高对此类设备的理解和制造。

This project develops our recent findings for improving silicon grain boundaries in electronic devices such as cheap solar cells, active matrix displays, thin-film transistors, etc. The performance of such devices and their applications have been limited mainly because no simple link between manufacturing conditions and device quality has been found. However, we recently verified a physical model description of grain boundaries on a broad range of devices, and this allows us to find such a link and to address prevailing problems from a new perspective. This will improve both the understanding and the manufacturing of such devices.