Basic Study on Ultra-Precision Self-Profile-Generation
Basic Study on Ultra-Precision Self-Profile-Generation
批准号:
07455414
负责人:
KIYONO Satoshi
金额:
$1.22万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
1995
资助国家:
日本
项目状态:
已结题
起止时间:
1995 至 1996
中文摘要
应用软件基准技术,提出了一种新的超精密自轮廓生成系统。在本研究中,我们首先开发了一种新型研磨探头,同时作为力控制的位移探头。该探头利用原子力显微镜的原理,由一个力敏感杆和一个安装在紫菜中心的研磨垫和用于测量力杆倾角的光学探测器组成。杠杆的两端由PZT致动器保持。可以通过使用PZT致动器调节杠杆的倾斜度来控制加工力。另一方面,也可以从杠杆的倾斜度获得轮廓高度。标定结果表明,所研制的探头具有10 nm的位移分辨率。接下来,我们研究了使用三种新的研磨和测量探头扫描研磨轮廓测量的可能性。轮廓测量的方法是基于三点法构建软件基准。利用三个测头的输出数据信息,消除扫描运动中的俯仰误差和平移误差,可以实现具有测头精度的轮廓度测量。计算机仿真结果表明,采用绝对齿形测量技术可以检测并补偿软件基准法评定的研磨垫磨损量的抛物线误差。新系统的有效性也得到了轮廓测量和加工实验的验证。
英文摘要
A new ultra-precision self-profile-generation system by applying the technique of software datum has been proposed. In this research, we first developed a new kind of lapping probe that simultaneously acts as a force-controlled displacement probe. This probe, which utilize the principle of AFM,consists of a force sensing lever with a lapping pad attached at the center of the laver and optical detectors to measure the inclination of the lever. Both ends of the lever are held by PZT actuators. The machining force can be controlled by adjusting the inclination of the lever using the PZT actuators. On the other hand, the profile height can also be obtained from the inclination of the lever. Calibration results showed that the developed probe has a displacement resolution of 10nm. Next, we investigated the possibility of using three of the new lapping and measuring probes for scanning measurements of lapped profiles. The method of profile measurements is based on the 3-point method for constructing software datum. Profile measurements can be realized with the accuracy of the probe by canceling the pitching error and the translational error in the scanning motion using the information of the output data of the three probes. Computer simulations showed that abrasion amount of the lapping pad which results in a parabolic error in the evaluated profile with the method of software datum can be detected and compensated by using the proposed technique of absolute profile measurements. The effectiveness of the new system has also been confirmed by profile measurement and machining experiments.
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小岩秀貴,小倉一朗,高偉,清野 慧: "力制御型変位計による形状測定に関する研究" 精密工学会東北支部1995年度講演会論文集. 35-36 (1995)
Hidetaka Koiwa、Ichiro Ogura、Takayoshi 和 Kei Seino:“使用力控制位移计进行形状测量的研究”日本精密工程学会东北分会 1995 年会议记录 35-36 (1995)。
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小倉一朗、高偉、小岩秀樹、厨川常元、清野慧: "インプロセス測定器を用いた形状の自律的創成に関する基礎研究" 精密工学会1996年度秋季講演会論文集. 299-300 (1996)
Ichiro Ogura、Takayoshi、Hideki Koiwa、Tsunemoto Kuriyakawa、Kei Seino:“使用过程中测量仪器自主创建形状的基础研究”日本精密工程学会 1996 年秋季会议记录 299-300 (1996)。
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"Basic Study on Profile Generation without Using any Datum" Proceedings of 2nd International ABTEC Conference. 123 (1995)
“不使用任何数据的轮廓生成的基础研究”第二届国际ABTEC会议论文集。
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W. Gao, I. Ogura, E. Okuyama and S. Kiyono: "Self-Zero-Adjustment of Probes in the Methods Constructing Software Datum for Large Profile Measurement" International Journal of the JSPE. 30. 337-342 (1996)
W. 高、I. Ogura、E. Okuyama 和 S. Kiyono:“大轮廓测量软件数据构建方法中探头的自调零”JSPE 国际期刊。
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小倉一朗,舟橋順正,清野 慧: "インプロセス計測と組み合わせた圧力転写加工による形状創成の基礎研究" 精密工学会1995年度秋季講演会論文集. 577-578 (1995)
Ichiro Ogura、Junmasa Funahashi、Kei Seino:“压力传递加工与过程中测量相结合的形状创建的基础研究”日本精密工程学会 1995 年秋季会议记录 577-578 (1995)。
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