Optical properties of semiconductor nanostructures studied by in-stu optical spectroscopy in a transmission electron microscope.

我们开发了一种新的透射电子显微镜（TEM）与光谱学相结合的实验方法。在助学金的支持下，光学测量仪器已经非常先进，可以进行偏振测量。通过透射电镜同时观察到的一小块样品发射的光的偏振，现在可以进行分析。我们将这一先进技术应用于Cu-Pt型有序galnp半导体的发光研究。我们发现扩展缺陷，即所谓的反相边界（APB）作为量子阱，由于带间跃迁而发出外子光。这项新发现的关键实验数据是，我们已经令人信服地确定了光根据井结构是良好偏振的。我们还测量了用我们自己的晶体生长配方生长的硅纳米线发出的光。我们已经观察到偏振光，可能是由于量子约束，尽管还需要许多定性研究。总之，我们开发了新的实验技术，并证明了它非常适合于纳米结构和相关电子结构的研究。该技术将广泛应用于近年来备受关注的各种非均相纳米结构。

We have developed a new experimental method of transmission electronmicroscopy (TEM) combined with optical spectroscopy. Supported by the Grant-in-Aid, the apparatus for optical measurement has been much advanced, and is available for polarizing measurement. The polarization of light emitted from a small area of specimen, which is simultaneously observed by TEM, can now be analyzed. We have applied this advanced technique to study the light emitted from Cu-Pt type ordered GalnPsemiconductors. We have found that extended defects, so called antiphase boundary (APB) act as quantum wells which emits exitonic light due to interband transition. The key experimental data in this new finding is that we have determined convincingly that the light is well polarized according to the well structures.We have also measured the light emitted from silicon nanowires that were grown by our own recipe of crystal growth. We have observed polarized light presumably due to quantum confinement, even though much qualitative studies is needed.In conclusion, we have developed the new experimental technique, anddemonstrated that this is very much suitable for the studies on nanostructures and associated electronic structures. The techniques will be applied generally to various heterogeneous nanostructures which has gained much interest recently.