Development of an Embedded Process Detector Circuit Targeting Advanced CMOS Semiconductor Technologies

Moortec半导体有限公司为当今电子产品中使用的先进技术制造的硅芯片器件开发片上监控电路和知识产权（IP）。Moortec计划开发一种原型嵌入式工艺检测器电路，也称为工艺监控器，该电路将测量在28纳米（nm）、16纳米和14纳米等先进CMOS技术节点上制造的电路的可变性。随着硅CMOS技术的进步和晶体管沟道长度缩放到纳米尺寸，工艺引起的电路延迟变化已经开始显著影响芯片性能和功耗。Moortec的工艺检测器（PD）将拥有超越目前半导体器件设计者和开发者商业可用的功能和应用。PD将允许硅芯片自行确定其制造工艺特性，为系统的其余部分提供有关如何优化其性能的信息。然后，片上系统（SoC）可以针对其功耗或计算或数据传输速度进行优化。PD还将允许所有硅器件经受的老化效应由系统测量和监测，可能在器件的整个寿命期间。

Moortec Semiconductor Ltd develop on-chip monitoring circuits and intellectual property (IP) for silicon chip devices manufactured on advanced technologies used in today’s electronics products. Moortec plan to develop a prototype embedded process detector circuit, otherwise known as a process monitor, that will measure the variability of circuits manufactured on advanced CMOS technology nodes such as 28 nano-meter (nm), 16nm and 14nm. With advances in silicon CMOS technology and the scaling of transistor channel lengths to nanometer dimensions, process induced variations in circuit delays have begun to significantly impact chip performance and power consumption. Moortec’s Process Detector (PD) will possess features and address applications that go beyond what is currently commercially available to the designers and developers of semiconductor devices. The PD will allow a silicon chip to self-determine its own manufactured process characteristics, providing information to the rest of the system as to how its performance can be optimised. The System on Chip (SoC) can then be optimised for either its power consumption or its speed for computations or data transfer. The PD will also allow for the ageing effects, which all silicon devices are subjected to, to be measured and monitored by the system, potentially throughout the lifetime of the device.