National Facility for High Resolution CL Analysis of Photovoltaic and Optoelectronic Devices

建立一个国家设施，用于光伏和光电器件的高分辨率阴极发光分析。该设施将使大学和工业研究人员能够将发光与缺陷，微观结构和成分关联到纳米级。该设施将包括：1. CL在配备氙等离子体聚焦离子束（FIB）的双束扫描电子显微镜（SEM）上进行。Xe FIB将用于从SEM-CL中检测到的特征中提取薄片，以进行高分辨率透射电子显微镜分析。2.该实验室将在全球范围内独一无二，有助于保持英国在光伏和光电器件开发领域的研究领导者地位。

To establish a National Facility for High Resolution Cathodoluminescence (CL) analysis of photovoltaic and optoelectronic devices. The facility will enable university and industrial researchers to correlate luminescence with defects, microstructure and composition down to the nanoscale. The facility will comprise: 1. CL on a dual beam Scanning Electron Microscope (SEM) equipped with a Xenon plasma Focused Ion Beam (FIB). The Xe FIB will be used to extract lamellae from features detected in the SEM-CL for high resolution Transmission Electron Microscope analysis.2. CL on a dedicated Scanning Transmission Electron Microscope (STEM) for nanoscale analysis.The facility will be unique world-wide and help maintain the UK's position as a research leader in photovoltaic and optoelectronic device development.