DATA ACQUISITION SYSTEM FOR ULTRAHIGH-RESOLUTION DEDICATED STEM

正在为真空系统开发自动数据采集系统。 发生器HB 501超高分辨率专用扫描传输 电镜 这类计算机的新分析能力 电子显微镜需要新的方法使数据计算机化 采集和分析。 可用的商业系统有限 在这两种类型的数据，可以同时获得和 用于处理数据的算法。 作为该系统的一部分， 数据采集和分析程序，称为台式频谱分析仪 和X射线数据库（DTSA），已开发的Macintosh II（和 更高级别的计算机。 完成了数据采集 利用专门修改的商业插入总线卡和控制 与控制和分析软件接口的软件例程 在DTSA。 一项由NIH和NIST共同持有的专利正在等待批准。 这个分析工具。 DTSA可从标准办公室获得 参考数据（OSRD），国家标准与技术研究所， 只收一点钱OSRD已获得版权。

An automated data acquisition system is being developed for the Vacuum Generators HB 501 ultrahigh-resolution dedicated scanning transmission electron microscope. The new analytical capabilities of this class of electron microscope require fresh approaches to computerization of data acquisition and analysis. Available commercial systems have been limited in both the kinds of data that can be acquired concurrently and the algorithms for processing the data. As part of this system, a desktop data acquisition and analysis program, called Desk Top Spectrum Analyzer and X-Ray Database (DTSA), has been developed for the Macintosh II (and higher) class of computers. The data acquisition is accomplished utilizing specially modified commercial plug-in bus cards and control software routines that interface to the control and analytical software of DTSA. A patent, to be held jointly by the NIH and NIST, is pending on this analytical tool. The DTSA is available from the Office of Standard Reference Data (OSRD), National Institute of Standards and Technology, for a modest fee. A copyright has been obtained by the OSRD.