DATA ACQUISITION SYSTEM FOR ULTRAHIGH-RESOLUTION STEM

HB501真空发生器自动数据采集系统 超高分辨率专用扫描透射式电子显微镜 正在开发中。这类电子的新分析能力 显微镜需要新的数据采集计算机化方法 和分析。可用的商业系统在这两个方面都受到限制 可并发采集的数据种类和算法 处理数据。作为该系统的一部分，桌面数据采集 并开发了适用于Macintosh II的分析程序DTSA 计算机(和更高级别)的类别。完成了数据的采集 利用特别改装的商用插件式总线卡和控制器 与控制和分析软件接口的软件例程。一个 由NIH和NIST联合持有的专利正在申请中 分析工具。

An automated data-acquisition system for the Vacuum Generators HB 501 ultrahigh-resolution dedicated scanning transmission electron microscope is being developed. The new analytical capabilities of this class of electron microscope require fresh approaches to computerization of data acquisition and analysis. Available commercial systems have been limited in both the kinds of data that can be acquired concurrently and the algorithms for processing the data. As part of this system, a desktop data-acquisition and analysis program, called DTSA, has been developed for the Macintosh II (and higher) class of computers. The data acquisition is accomplished utilizing specially modified commercial plug-in bus cards and control software routines that interface to the control and analytical software. A patent, to be held jointly by the NIH and NIST, is pending on this analytical tool.