New Geometrical Filtration for Ultra-Precision and Micro/Nano Manufactured Products

在过去的十年中，高价值、微米和纳米级器件的设计和制造(在光子学、电信、航空航天、汽车、国防、生物技术、医疗和消费应用中)已逐渐从学术研究转向工业制造部门。计算设计技术和超精密以及微/纳米制造能力等使能技术促进了这些部件的设计。然而，实现这些产品潜在增长的一个根本障碍是提供计量基础设施，以便以所需的精度测量和表征这些部件，以便可以控制它们的制造质量。达到高质量控制水平的企业将获得更大的市场份额。这项拟议的两年项目试图提供工具，使这些超精密和微/纳米尺度的产品能够进行几何表征。该项目将开发新的非线性几何过滤技术。它将集中于处理确定性工程表面特征/结构的微/纳米几何特征的稳健方法，为非线性过滤创建快速准确的算法(在制造环境中实施)和参考算法(用于建立对国家计量标准的可追溯性)，以及它们的实施和使用的最佳实践指导。拟议项目的联合体由哈德斯菲尔德大学表面计量组(SMG)、国家物理实验室(NPL，英国国家计量研究所)和仪器制造商Taylor Hobson Limited(TH)组成。这三个合作伙伴共同解决创新、发展国家测量基础设施的要求，重点是经过验证的算法和软件，以及行业相关性和适用性。这项研究将使英国工业能够为高科技产品建立新的质量控制体系，并支持政府对高附加值制造的使命：将产能时间缩短60%；将上市时间缩短60%，并将产品成本降低50%。

In the last decade, the design and fabrication of high value, micro- and nanoscale devices (in photonics, telecommunication, aerospace, automotive, defence, biotech, medical and consumer applications) has gradually moved from academic research to industrial manufacturing sectors. Enabling technologies such as computing design technology and ultra-precision and micro/nano- manufacturing capabilities have facilitated the design of these components. However, a fundamental barrier to achieving the potential growth of these products is in providing the metrological infrastructure to measure and characterise these components with the required accuracy so that their manufacturing quality can be controlled. Enterprises that achieve high levels of quality control will secure a larger market share.This proposed two-year project attempts to provide tools to enable the geometrical characterisation of these ultra precision and micro/nano-scale products. The project will develop novel non-linear geometrical filtration techniques. It will focus on robust approaches for micro/nano geometrical features that cope with deterministic engineered surface features/structures, create fast accurate algorithms (implementation in the manufacture context) and reference algorithms (for establishing traceability to national metrology standards) for non-linear filtration, together with best practice guidance for their implementation and use.The consortium for the proposed project is comprised of the Surface Metrology Group (SMG) at the University of Huddersfield, the National Physical Laboratory (NPL, the UK's national metrology institute) and the instrumentation manufacturer Taylor Hobson Limited (TH). The three partners together address the requirements for innovation, development of the national measurement infrastructure, with emphasis on validated algorithms and software, and industrial relevance and applicability. The research will enable UK industry to establish new quality control systems for high-tech products and support the mission of the government for high-added value manufacture: 60% shorter throughput time; 60% shorter time to market and 50% reduction in product costs.