WIDE-FIELD REFLECTION PHASE MICROSCOPY

这个子项目是许多研究子项目中的一个 由NIH/NCRR资助的中心赠款提供的资源。子项目及 研究者（PI）可能从另一个NIH来源获得了主要资金， 因此可以在其他CRISP条目中表示。所列机构为 研究中心，而研究中心不一定是研究者的研究机构。 本计画的目标是设计并研制一种基于低相干时域干涉术的宽视场反射式相位显微镜。相位显微镜的独特光学设计允许参考光束以一定角度与信号光束干涉，使得两个光束在整个视场中的路径长度相同。这导致由高频空间条纹调制的样品相位的单次记录。最后，这些单次拍摄的干涉图可以被处理以确定相位，从而确定与所研究的表面相关的亚纳米运动。

This subproject is one of many research subprojects utilizing the resources provided by a Center grant funded by NIH/NCRR. The subproject and investigator (PI) may have received primary funding from another NIH source, and thus could be represented in other CRISP entries. The institution listed is for the Center, which is not necessarily the institution for the investigator. The goal of this project is to design and develop a wide-field reflection phase microscope based on low-coherence time-domain interferometry. The unique optical design of the phase microscope allows the reference optical beam to interfere with the signal beam at an angle in such a manner that the path length across the whole field of view is same for both the beams. This leads to single-shot recording of the sample phase modulated by high frequency spatial fringes. Finally, these single-shot interferograms can be processed to determine the phase and hence sub-nanometer motions associated with the surface under study.