Diagnostic Electron Microscopy (EM)

透射电子显微镜（EM）是一种辅助手段，用于诊断各种肿瘤性和非肿瘤性疾病，在精心选择的诊断困境中非常有用。该服务由CAP定期检查和认证，是NIH校园内唯一获得CAP认证的诊断EM服务。去年共处理了150个案件，包括350个街区。 提交给我们服务进行超微结构评估的诊断标本来自NCI/NIH方案治疗的患者，在诊断和科学上具有挑战性。由于NCI方案的性质，我们通常是第一个描述肿瘤或疾病的不寻常和独特的超微结构发现，或实验治疗的结果。目前的EM项目包括与特定遗传背景相关的副神经节瘤和肾细胞癌的形态学特征。

Transmission electron microscopy (EM) is used as an adjunct procedure in the diagnosis of a wide range of neoplastic and non neoplastic diseases and can be extremely useful in well chosen diagnostic dilemmas. The service is regularly inspected and certified by CAP, and is the only diagnostic CAP-certified EM service on NIH campus. A total of 150 cases were processed last year, consisting of 350 blocks. The diagnostic specimens that are submitted to our service for ultrastructural evaluation are from patients treated in NCI/NIH protocols and are diagnostically and scientifically challenging. Due to the nature of the NCI protocols, we are often the first to describe the unusual and unique ultrastructural findings of a tumor or disease, or the outcome of experimental treatments. Current EM projects include the morphologic characterization of paragangliomas and renal cell carcinomas associated with specific genetic backgrounds.