Photoemission yield spectrometer for surfaces and semiconductors

我们寻求资金以获得大气压光电子产额光谱仪（PEYS），以表征表面，半导体薄膜和其他先进材料。PEYS允许对金属的功函数、半导体的导带以及分子/聚合物薄膜和粉末的HOMO进行“软”非破坏性测量。这正在成为有机电子学中的“必备”技术，并且同样会在许多相关领域（量子点，自组装单层等）产生变革性影响。然而，加拿大没有这种文书。目前的替代方法是电化学和紫外光电子能谱（UPS）测量的组合，这要复杂得多。此外，它们提供的能级存在显著的模糊性，并且这些能级受到环境（电解质或超高真空）的强烈影响。该仪器将成为中央部门的材料表征设施，被麦吉尔大学和其他魁北克大学的几十个研究小组广泛使用（通过魁北克先进材料中心-CQMF）。我们估计，每年至少有10-20名学生将接受PEYS使用方面的实践培训，CQMF研究助理（P. Fiurasek）将为加拿大各地的许多其他学术团体进行样本测量。

We seek funding to acquire an atmospheric pressure photoelectron yield spectrometer (PEYS) to characterize surfaces, semiconducting films and other advanced materials. PEYS allows “soft” non-destructive measurements of workfunction of metals, conductance band of semiconductors and HOMO of molecular/polymer films and powders. This is becoming a “must have” technology in organic electronics, and would likewise have a transformational effect in many related fields (quantum dots, self-assembled monolayers, etc). However, no such instruments are available in Canada. The current alternative is a combination of electrochemical and ultra-violet photoelectron spectroscopy (UPS) measurements which are significantly more complicated. Furthermore, there is a significant ambiguity in the energy levels they provide, and these are strongly affected by the environment (electrolyte or ultra-high vacuum). The instrument will become a central departmental materials characterization facility, which is used extensively by several dozens research groups at McGill and other Quebec universities (via Quebec Center for Advanced Materials -CQMF). We estimate that at least 10-20 students will receive hands-on training in the use of PEYS each year, and the CQMF research associate (P. Fiurasek) will perform sample measurements for many other academic groups throughout Canada.