CISE Educational Infrastructure: Courseware for Computer-Aided Design and Test
CISE Educational Infrastructure: Courseware for Computer-Aided Design and Test
批准号:
9414173
负责人:
Duncan Walker
金额:
$31.83万
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
1994
资助国家:
美国
项目状态:
已结题
起止时间:
1994-09-01 至 1998-08-31
中文摘要
这项工作的目的是为计算机工程专业的学生提供计算机辅助设计(CAD)和集成系统测试的算法和软件的最新背景知识。在CAD和test两门高级课程中使用了一套完整的课件和课堂讲稿。该课件由小型模块化CAD和测试程序组成,具有算法可视化功能。该软件的设计使学生可以很容易地修改和观察其内部操作,以深入了解算法和数据结构。向其他大学的技术转让是通过与姐妹机构和教学讲习班的合作实现的。电子用户组为教师和学生提供持续的共享学习。课件和课堂讲稿易于部署和修改,适合于课堂演示。其结果是,毕业的计算机工程师具备了解最新CAD和测试工具的操作、功能和局限性的知识和技能,具备合理使用这些工具和开发新工具的背景知识。这样的学生可以立即开始在电子和设计自动化行业的生产工作,并跟上他们的快速发展。***
英文摘要
9414173 Walker The objective of this work is to provide computer engineering students with a current background in algorithms and software for computer-aided design (CAD) and test of integrated systems. An integrated set of courseware and lecture notes is used in two senior-level courses on CAD and test. The courseware consists of small, modular CAD and test programs with facilities for algorithm visualization. The software is designed so that students can easily modify it and observe its internal operation, to gain insight into the algorithms and data structures. Technology transfer to other universities is achieved through cooperation with sister institutions and teaching workshops. An electronic users group provides continuous shared learning for instructors and students. The courseware and lecture notes are implemented for easy deployment and modification, and are suitable for in-class demonstrations. The outcome is graduating computer engineers who have the knowledge and skills to understand the operation, capabilities, and limitations of the latest CAD and test tools, to have the background to sensibly use such tools and to develop new tools. Such students can immediately begin productive work in the electronics and design automation industries, and keep up with their rapid advances. ***
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会议论文
SHF: Small: High Quality Test and Post-Silicon Validation of System-On-Chip Integrated Circuits
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批准号:1117982
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项目类别:Standard Grant
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资助金额:$40.0万
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财政年份:2011
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负责人:Duncan Walker
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依托单位:
Delay Test and Diagnosis Considering DSM and Power
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批准号:0702669
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资助金额:$15.0万
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财政年份:2007
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负责人:Duncan Walker
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依托单位:
Reliability Screening via Outlier Analysis
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批准号:0306572
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项目类别:Continuing Grant
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资助金额:$23.0万
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财政年份:2003
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负责人:Duncan Walker
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依托单位:
Delay Fault Modeling, Test, and Diagnosis
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批准号:0098329
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项目类别:Continuing Grant
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资助金额:$31.63万
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财政年份:2001
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依托单位:
Built-In IDDQ Sensors for Deep-Submicron Circuits
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批准号:9971192
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项目类别:Standard Grant
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资助金额:$19.33万
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财政年份:1999
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负责人:Duncan Walker
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依托单位:
Novel Methods in Computer-Aided Circuit Design and Testing Using Recursive Learning
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批准号:9406946
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项目类别:Continuing Grant
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资助金额:$32.37万
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财政年份:1994
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负责人:Duncan Walker
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依托单位:
1990 International Workshop on Defect and Fault Tolerance inVLSI Systems; Grenoble, France; November 5-7, 1990
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批准号:9014723
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项目类别:Standard Grant
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资助金额:$0.7万
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财政年份:1990
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负责人:Duncan Walker
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依托单位:
海外基金