Acquisition of Electrospray LC-MS-MS Instrumentation

购置电喷雾 LC-MS-MS 仪器

• 批准号: 9513204
• 负责人: Richard Van Breemen
• 金额: $ 9万
• 依托单位: University of Illinois at Chicago
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1996
• 资助国家: 美国
• 起止时间: 1996-05-01 至 1998-04-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9513204&HistoricalAwards=false
• 关键词: Acquisition; Electrospray; LC; MS; Instrumentation

The proposal is for the acquisition of a Field-Emission Gun Scanning Electron Microscope (FEG-SEM) and associated X-ray microanalysis system. Field emission electron sources are very stable even at low accelerating voltages (1 KeV) and their usage in a SEM greatly enhances the capabilities of a FEG-SEM when compared with instruments that use a thermionic emitter electron source. The most significant advantage of a FEG-SEM is its ability to image specimens that are below the limits of resolution of a conventional SEM. A FEG-SEM can have a resolution that is 1 to 1.5 orders of magnitude greater than a comparable conventional SEM. The fact that a FEG-SEM can operate at low accelerating voltages means that one is often able to examine samples that do not require much additional conductive coating. Despite the large number of researchers at the University of Georgia who routinely use scanning electron microscopy, a SEM of suitable quality for high resolution/low KeV work is presently not available anywhere on campus. The ability to create SEM images of microscopic specimens is of critical importance to a wide variety of researchers at the University of Georgia. This is especially important when one is working at very high magnifications where the coating itself may be what is visualized and not the object of study. As configured, this FEG-SEM would also enable researchers to conduct elemental analyses using EDS X-ray at a much higher level of precision than is possible with the Center's present instrument. A final advantage that a FEGSEM has over the Center's present SEM is the ability to capture the images digitally in a high resolution format that can then be further processed or analyzed either on the Center's imaging computers or on any computer linked to the Ethernet. The Center for Ultrastructural Research is the central facility that provides University of Georgia researchers a variety of specialized equipment and expertise in the area of electron and light mic roscopy. For the past five years the Center has assisted with an average of 60 different research laboratories representing 25 different departments or academic units per year. The Center also teaches formal courses (Scanning Electron Microscopy, Transmission Electron Microscopy, Techniques in Modern Microscopy) to both graduate and undergraduates students. The addition of a FEG-SEM to the Center would greatly enhance the research capabilities of those working with both biological and non-biological specimens and is seen as a critical acquisition in ensuring that researchers and students have access to state of the art imaging instruments.

该提议是为了购置一台场发射枪扫描电子显微镜和相关的X射线微量分析系统。即使在低加速电压（1 KeV）下，场发射电子源也非常稳定，并且与使用热离子发射极电子源的仪器相比，它们在SEM中的使用大大增强了FEG-SEM的功能。FEG-SEM最显著的优点是它能够对低于常规SEM分辨率极限的样品进行成像。FEG-SEM可以具有比可比较的常规SEM大1至1.5个数量级的分辨率。FEG-SEM可以在低加速电压下工作的事实意味着人们通常能够检查不需要太多额外导电涂层的样品。 尽管格鲁吉亚大学的大量研究人员经常使用扫描电子显微镜，但目前校园内任何地方都没有适合高分辨率/低KeV工作的SEM。创建显微标本的SEM图像的能力对格鲁吉亚大学的各种研究人员至关重要。这一点尤其重要，当一个人在非常高的放大倍率下工作时，涂层本身可能是可视化的，而不是研究的对象。根据配置，该FEG-SEM还将使研究人员能够使用EDS X射线进行元素分析，其精度比中心现有仪器高得多。FEGSEM与中心现有SEM相比的最后一个优势是能够以高分辨率格式数字化捕获图像，然后可以在中心的成像计算机或连接到以太网的任何计算机上进一步处理或分析。 超微结构研究中心是为格鲁吉亚大学研究人员提供电子和光学显微镜领域各种专业设备和专业知识的中心设施。 在过去的五年中，该中心平均每年为代表25个不同部门或学术单位的60个不同的研究实验室提供协助。该中心还教授正规课程（扫描电子显微镜，透射电子显微镜，现代显微镜技术）的研究生和本科生。该中心增加了一台FEG-SEM，将大大提高生物和非生物标本研究人员的研究能力，并被视为确保研究人员和学生获得最先进成像仪器的关键收购。