Effect of Defects on the Magnetic Properties of 2D Films Using Patterned Substrates

缺陷对使用图案化基底的 2D 薄膜磁性能的影响

• 批准号: 9623283
• 负责人: Edward Conrad
• 金额: $ 24万
• 依托单位: Georgia Tech Research Corporation
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 1996
• 资助国家: 美国
• 起止时间: 1996-07-01 至 1999-10-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9623283&HistoricalAwards=false
• 关键词: Effect; Defects; Magnetic; Properties; 2D

9623283 Conrad This project will investigate how structural defects on length scales approaching 2 nm will affect the magnetic properties. The project has technological importance because the demand for higher storage densities in recording media is expected to push magnetic clusters sizes below a 2 nm radius. A novel set of patterned tungsten substrates will be used to carry out such a study. These surfaces consist of a periodic staircase with each step one atom high. By controlled growth conditions, 2-dimensional iron films can be forced to grow out from the substrate steps to produce equal spaced one-dimensional magnetic wires. The gaps between these wires play the role of imperfections in a 2-dimensional magnetic film. Since both wire width (2 to 10 atoms and wire separation (1 to 20 atoms) can be independently varied, we will explore finite wire width effects and coupling between isolated wires on the iron film's magnetic properties. The work will be carried out using a combination of high resolution Low Energy Electron Diffraction, Surface Magneto-Optical Kerr effect, and Scanning Tunneling Microscopy. %%% The influence of atomic defects on magnetic film properties will play an important role in developing the next generation of high density recording media. The demand for higher storage densities is expected to push the diameter of magnetic clusters down to sizes of 6 to 10 atoms. It is therefore important to understand how magnetic properties are affected by limiting the magnetic films to contain less than 100 atoms. We have devised a novel technique to grow arrays of thin (3 to 10 atoms wide) parallel magnetic wires. These wires will be used to study how wire thickness and wire separation influence their magnetic properties. The critical wire thickness required to develop a magnetic moment and the effects of neighboring wires on th e magnetic properties of an individual wire will be studied. ***

这个项目将研究长度接近2nm的结构缺陷如何影响磁性能。该项目在技术上具有重要意义，因为对记录介质中更高存储密度的需求预计将推动磁簇尺寸小于2nm半径。一套新的图案钨衬底将用于进行这样的研究。这些表面由每一级原子高的周期性阶梯组成。通过控制生长条件，二维铁膜可以从衬底台阶生长出来，从而产生等间距的一维磁线。这些导线之间的间隙在二维磁膜中起着缺陷的作用。由于导线宽度（2到10个原子）和导线间距（1到20个原子）都可以独立变化，我们将探索有限导线宽度效应和隔离导线之间的耦合对铁膜磁性能的影响。这项工作将结合使用高分辨率低能电子衍射、表面磁光克尔效应和扫描隧道显微镜进行。原子缺陷对磁薄膜性能的影响将在开发下一代高密度记录介质中发挥重要作用。对更高存储密度的需求有望将磁性团簇的直径降低到6到10个原子的大小。因此，重要的是要了解如何通过限制磁性薄膜包含少于100个原子来影响磁性。我们已经设计了一种新的技术来生长细的（3到10个原子宽）平行磁线阵列。这些导线将用于研究导线厚度和导线间距对其磁性能的影响。将研究产生磁矩所需的临界导线厚度以及相邻导线对单个导线磁性能的影响。＊＊＊